Inventor
WOJSZYNSKI BRIAN J
US4 patents
Patents
4 patentsUS5917329AJun 29, 1999
Substrate tester having shorting pad actuator method and apparatus
IBM30 citations90
US6005386ADec 21, 1999
Substrate tester method and apparatus having rotatable and infinitely adjustable locator jaws
IBM10 citations71
US6753688B2Jun 22, 2004
Interconnect package cluster probe short removal apparatus and method
IBM3 citations56
US7808257B2Oct 5, 2010
Ionization test for electrical verification
IBM0 citations46