Inventor

YEH MENG-LIN

TW4 patents

⚠️ This page may combine multiple inventors who share the name “YEH MENG-LIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

UNITED SEMICONDUCTOR CORP

2 patents

US6133055AOct 17, 2000

Method of forming a test key architecture

UNITED SEMICONDUCTOR CORP15 citations69

US5949240ASep 7, 1999

Test connecting device including testkey and probe card for use in the testing of integrated circuits

UNITED SEMICONDUCTOR CORP9 citations69

UNITED SEMICONDUCTOR CIRCUIT C

1 patent

US6046601AApr 4, 2000

Method for measuring the kink effect of a semiconductor device

UNITED SEMICONDUCTOR CIRCUIT C10 citations68

UNITED SEMICONDUTOR CIRCUIT CO

1 patent

US6060900AMay 9, 2000

Method for measuring current density in a semiconductor device with kink effect

UNITED SEMICONDUTOR CIRCUIT CO5 citations53