Inventor
MATSUNAGA KOUJI
JP25 patents
⚠️ This page may combine multiple inventors who share the name “MATSUNAGA KOUJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
DENSO CORP
14 patentsUS6299409B1Oct 9, 2001
Centrifugal type blower unit
DENSO CORP83 citations98
US5839879ANov 24, 1998
Centrifugal blower
DENSO CORP84 citations96
US5813831ASep 29, 1998
Centrifugal blower having a bell-mouth ring for reducing noise
DENSO CORP90 citations96
US6821088B2Nov 23, 2004
Centrifugal blower having noise-reduction structure
DENSO CORP45 citations92
US6575701B2Jun 10, 2003
Blower for vehicle
DENSO CORP21 citations92
US6030286AFeb 29, 2000
Centrifugal blower having a plurality of sub blades
DENSO CORP26 citations92
US5746577AMay 5, 1998
Centrifugal-type blower
DENSO CORP27 citations92
US6644559B2Nov 11, 2003
Vehicle air conditioner with foot air-outlet structure
DENSO CORP23 citations91
US6755046B2Jun 29, 2004
Vehicle air conditioner with heat pump refrigerant cycle
DENSO CORP17 citations84
US6675598B2Jan 13, 2004
Vehicle air conditioner with arrangement structure of face ducts
DENSO CORP8 citations72
US6625994B2Sep 30, 2003
Vehicle air conditioning air duct system
DENSO CORP10 citations71
US7377554B2May 27, 2008
Seal structure for vehicle air conditioner
DENSO CORP8 citations67
US6640571B2Nov 4, 2003
Air conditioning apparatus for vehicle
DENSO CORP6 citations61
US10639969B2May 5, 2020
Air conditioner for vehicle
DENSO CORP0 citations36
NEC CORP
10 patentsUS6492669B2Dec 10, 2002
Semiconductor device with schottky electrode having high schottky barrier
NEC CORP134 citations98
US6465814B2Oct 15, 2002
Semiconductor device
NEC CORP104 citations98
US6400168B2Jun 4, 2002
Method for fabricating probe tip portion composed by coaxial cable
NEC CORP116 citations96
US6310483B1Oct 30, 2001
Longitudinal type high frequency probe for narrow pitched electrodes
NEC CORP116 citations96
US6281691B1Aug 28, 2001
Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cable
NEC CORP119 citations96
US6440822B1Aug 27, 2002
Method of manufacturing semiconductor device with sidewall metal layers
NEC CORP19 citations92
US6242930B1Jun 5, 2001
High-frequency probe capable of adjusting characteristic impedance in end part and having the end part detachable
NEC CORP41 citations91
US6486688B2Nov 26, 2002
Semiconductor device testing apparatus having a contact sheet and probe for testing high frequency characteristics
NEC CORP8 citations73
US7688134B2Mar 30, 2010
Transimpedance amplifier
NEC CORP2 citations62
US6229321B1May 8, 2001
Process for manufacturing high frequency multichip module enabling independent test of bare chip
NEC CORP4 citations61