Inventor
NIKAIDOU MASAHIKO
JP5 patents
Patents
5 patentsUS6400168B2Jun 4, 2002
Method for fabricating probe tip portion composed by coaxial cable
NEC CORP116 citations96
US6281691B1Aug 28, 2001
Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cable
NEC CORP119 citations96
US6242930B1Jun 5, 2001
High-frequency probe capable of adjusting characteristic impedance in end part and having the end part detachable
NEC CORP41 citations91
US6229321B1May 8, 2001
Process for manufacturing high frequency multichip module enabling independent test of bare chip
NEC CORP4 citations61
US6807000B2Oct 19, 2004
Gain measurement device for optical amplifier and method thereof
NEC CORP0 citations39