Inventor
TAURA TORU
JP16 patents
⚠️ This page may combine multiple inventors who share the name “TAURA TORU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC CORP
9 patentsUS6400168B2Jun 4, 2002
Method for fabricating probe tip portion composed by coaxial cable
NEC CORP116 citations96
US6310483B1Oct 30, 2001
Longitudinal type high frequency probe for narrow pitched electrodes
NEC CORP116 citations96
US6281691B1Aug 28, 2001
Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cable
NEC CORP119 citations96
US6242930B1Jun 5, 2001
High-frequency probe capable of adjusting characteristic impedance in end part and having the end part detachable
NEC CORP41 citations91
US7906846B2Mar 15, 2011
Semiconductor device for implementing signal transmission and/or power supply by means of the induction of a coil
NEC CORP8 citations83
US7852101B2Dec 14, 2010
Semiconductor device testing apparatus and power supply unit for semiconductor device testing apparatus
NEC CORP7 citations73
US6486688B2Nov 26, 2002
Semiconductor device testing apparatus having a contact sheet and probe for testing high frequency characteristics
NEC CORP8 citations73
US5614944AMar 25, 1997
Test method and apparatus of sequentially executing synchronous signal test, dot level test, and gradation test of a video signal generator
NEC CORP10 citations73
US6229321B1May 8, 2001
Process for manufacturing high frequency multichip module enabling independent test of bare chip
NEC CORP4 citations61