Inventor
NAKAYAMA TOSHIHIRO
JP35 patents
⚠️ This page may combine multiple inventors who share the name “NAKAYAMA TOSHIHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ASAHI OPTICAL CO LTD
22 patentsUS6148097ANov 14, 2000
Optical member inspecting apparatus and method of inspection thereof
ASAHI OPTICAL CO LTD47 citations96
US5847822ADec 8, 1998
Optical element inspecting apparatus
ASAHI OPTICAL CO LTD55 citations96
US5828500AOct 27, 1998
Optical element inspecting apparatus
ASAHI OPTICAL CO LTD76 citations96
US6476909B1Nov 5, 2002
Optical member inspecting apparatus and method of inspection thereof
ASAHI OPTICAL CO LTD16 citations93
US5835207ANov 10, 1998
Optical member inspecting apparatus
ASAHI OPTICAL CO LTD31 citations93
US6304669B1Oct 16, 2001
Photogrammetric analytical measurement system
ASAHI OPTICAL CO LTD32 citations92
US6144761ANov 7, 2000
Photogrammetric analytical measurement system
ASAHI OPTICAL CO LTD42 citations92
US6108497AAug 22, 2000
Standard measurement scale and markers for defining standard measurement scale
ASAHI OPTICAL CO LTD43 citations92
US5995765ANov 30, 1999
Camera with distance-measuring sensor unit for use in photogrammetric analytical measurement
ASAHI OPTICAL CO LTD24 citations92
US6804386B1Oct 12, 2004
Optical member inspecting apparatus and method of inspection thereof
ASAHI OPTICAL CO LTD11 citations82
US6697513B1Feb 24, 2004
Optical member inspecting apparatus and method of inspection thereof
ASAHI OPTICAL CO LTD9 citations82
US6349145B1Feb 19, 2002
Optical member inspecting apparatus and method of inspection thereof
ASAHI OPTICAL CO LTD8 citations82
US6636625B1Oct 21, 2003
Optical member inspecting apparatus and method of inspection thereof
ASAHI OPTICAL CO LTD5 citations74
US6535627B1Mar 18, 2003
Optical member inspecting apparatus and method of inspection thereof
ASAHI OPTICAL CO LTD3 citations74
US6477264B1Nov 5, 2002
Optical member inspecting apparatus and method of inspection thereof
ASAHI OPTICAL CO LTD2 citations74
US6430310B1Aug 6, 2002
Optical member inspecting apparatus and method of inspection thereof
ASAHI OPTICAL CO LTD2 citations74
US6339683B1Jan 15, 2002
Standard measurement scale and markers for defining standard measurement scale
ASAHI OPTICAL CO LTD13 citations74
US6314200B1Nov 6, 2001
Optical member inspecting apparatus and method of inspection thereof
ASAHI OPTICAL CO LTD4 citations74
US6788804B1Sep 7, 2004
Optical member inspecting apparatus and method of inspection thereof
ASAHI OPTICAL CO LTD0 citations63
US6434263B1Aug 13, 2002
Optical member inspecting apparatus and method of inspection thereof
ASAHI OPTICAL CO LTD1 citations63
US6427023B1Jul 30, 2002
Optical member inspecting apparatus and method of inspection thereof
ASAHI OPTICAL CO LTD1 citations63
US6363165B1Mar 26, 2002
Optical member inspecting apparatus and method of inspection thereof
ASAHI OPTICAL CO LTD0 citations52
PENTAX CORP
9 patentsUS6768813B1Jul 27, 2004
Photogrammetric image processing apparatus and method
PENTAX CORP43 citations92
US6628803B1Sep 30, 2003
Device for calculating positional data of standard points of photogrammetric target
PENTAX CORP23 citations92
US6618497B1Sep 9, 2003
Photogrammetric image processing apparatus and method
PENTAX CORP23 citations92
US6618498B1Sep 9, 2003
Image processing computer system for photogrammetric analytical measurement
PENTAX CORP34 citations92
US6600511B1Jul 29, 2003
Camera for use in photogrammetric analytical measurement
PENTAX CORP42 citations92
US6762766B1Jul 13, 2004
Image processing computer system for photogrammetric analytical measurement
PENTAX CORP13 citations84
US6717683B1Apr 6, 2004
Target for photogrammetric analytical measurement system
PENTAX CORP15 citations84
US6954217B1Oct 11, 2005
Image processing computer system for photogrammetric analytical measurement
PENTAX CORP8 citations74
US6693650B2Feb 17, 2004
Image processing computer system for a photogrammetric analytical measurement
PENTAX CORP9 citations73