Inventor
WAICUKAUSKI JOHN
US4 patents
Patents
4 patentsUS6385750B1May 7, 2002
Method and system for controlling test data volume in deterministic test pattern generation
SYNOPSYS INC97 citations97
US6453437B1Sep 17, 2002
Method and system for performing transition fault simulation along long circuit paths for high-quality automatic test pattern generation
SYNOPSYS INC32 citations92
US6959272B2Oct 25, 2005
Method and system for generating an ATPG model of a memory from behavioral descriptions
SYNOPSYS INC11 citations67
US10346557B2Jul 9, 2019
Increasing compression by reducing padding patterns
SYNOPSYS INC0 citations39