Inventor
KWONG CHARLES S
US3 patents
Patents
3 patentsUS11688467B2Jun 27, 2023
Defect detection in memories with time-varying bit error rate
MICRON TECHNOLOGY INC0 citations60
US11037637B2Jun 15, 2021
Defect detection in memories with time-varying bit error rate
MICRON TECHNOLOGY INC0 citations60
US12517816B2Jan 6, 2026
Model based error avoidance
MICRON TECHNOLOGY INC0 citations50