Inventor
SONG YEONGGEOL
KR17 patents
Patents
17 patentsUS11631448B1Apr 18, 2023
Memory device performing refresh operation and method of operating the same
SAMSUNG ELECTRONICS CO LTD10 citations85
US11106535B2Aug 31, 2021
Error correction circuit of semiconductor memory device and semiconductor memory device
SAMSUNG ELECTRONICS CO LTD7 citations83
US11860734B2Jan 2, 2024
Semiconductor memory devices and memory systems
SAMSUNG ELECTRONICS CO LTD2 citations72
US11762736B2Sep 19, 2023
Semiconductor memory devices
SAMSUNG ELECTRONICS CO LTD4 citations72
US11463110B2Oct 4, 2022
Memory controllers and memory systems including the same
SAMSUNG ELECTRONICS CO LTD3 citations72
US11314592B2Apr 26, 2022
Semiconductor memory devices and methods of operating semiconductor memory devices
SAMSUNG ELECTRONICS CO LTD5 citations72
US12542169B2Feb 3, 2026
Device, operating method, memory device, and CXL memory expansion device
SAMSUNG ELECTRONICS CO LTD0 citations62
US12354637B2Jul 8, 2025
Memory devices and methods thereof for managing row hammer events therein
SAMSUNG ELECTRONICS CO LTD0 citations62
US12236991B1Feb 25, 2025
Memory device performing refresh operation and method of operating the same
SAMSUNG ELECTRONICS CO LTD0 citations62
US12536070B2Jan 27, 2026
Memory device, operating method of memory device, and memory system including memory device
SAMSUNG ELECTRONICS CO LTD0 citations61
US12288578B2Apr 29, 2025
Semiconductor memory device and method of operating the same
SAMSUNG ELECTRONICS CO LTD0 citations60
US12066893B2Aug 20, 2024
Semiconductor memory devices
SAMSUNG ELECTRONICS CO LTD0 citations60
US11829614B2Nov 28, 2023
Semiconductor memory devices and methods of operating semiconductor memory devices
SAMSUNG ELECTRONICS CO LTD0 citations51
US11681458B2Jun 20, 2023
Memory device and method reading data
SAMSUNG ELECTRONICS CO LTD0 citations51
US12524302B2Jan 13, 2026
Semiconductor memory device and operating method thereof
SAMSUNG ELECTRONICS CO LTD0 citations50
US11841763B2Dec 12, 2023
Semiconductor memory devices with ECC engine defect determination based on test syndrome, test parity, expected decoding status and received decoding status
SAMSUNG ELECTRONICS CO LTD0 citations50
US11689224B2Jun 27, 2023
Error correction device and method for generating syndromes and partial coefficient information in a parallel
SAMSUNG ELECTRONICS CO LTD0 citations47