Inventor
SAITOH TOSHIHARU
US10 patents
⚠️ This page may combine multiple inventors who share the name “SAITOH TOSHIHARU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
9 patentsUS6397361B1May 28, 2002
Reduced-pin integrated circuit I/O test
IBM93 citations96
US6304122B1Oct 16, 2001
Low power LSSD flip flops and a flushable single clock splitter for flip flops
IBM42 citations92
US7073100B2Jul 4, 2006
Method for testing embedded DRAM arrays
IBM16 citations90
US7222274B2May 22, 2007
Testing and repair methodology for memories having redundancy
IBM23 citations86
US5689514ANov 18, 1997
Method and apparatus for testing the address system of a memory system
IBM10 citations72
US7237165B2Jun 26, 2007
Method for testing embedded DRAM arrays
IBM9 citations71
US6819160B2Nov 16, 2004
Self-timed and self-tested fuse blow
IBM5 citations61
US5826006AOct 20, 1998
Method and apparatus for testing the data output system of a memory system
IBM5 citations61
US7543203B2Jun 2, 2009
LSSD-compatible edge-triggered shift register latch
IBM3 citations53