Inventor
MIZUSHIMA ICHIRO
JP103 patents
⚠️ This page may combine multiple inventors who share the name “MIZUSHIMA ICHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
46 patentsUS6531754B1Mar 11, 2003
Manufacturing method of partial SOI wafer, semiconductor device using the partial SOI wafer and manufacturing method thereof
TOSHIBA KK250 citations99
US7019364B1Mar 28, 2006
Semiconductor substrate having pillars within a closed empty space
TOSHIBA KK74 citations98
US6835981B2Dec 28, 2004
Semiconductor chip which combines bulk and SOI regions and separates same with plural isolation regions
TOSHIBA KK88 citations98
US6617226B1Sep 9, 2003
Semiconductor device and method for manufacturing the same
TOSHIBA KK75 citations98
US6570217B1May 27, 2003
Semiconductor device and method of manufacturing the same
TOSHIBA KK96 citations98
US6346732B1Feb 12, 2002
Semiconductor device with oxide mediated epitaxial layer
TOSHIBA KK86 citations98
US6342421B1Jan 29, 2002
Semiconductor device and manufacturing method thereof
TOSHIBA KK168 citations98
US6335251B2Jan 1, 2002
Semiconductor apparatus having elevated source and drain structure and manufacturing method therefor
TOSHIBA KK123 citations98
US7009273B2Mar 7, 2006
Semiconductor device with a cavity therein and a method of manufacturing the same
TOSHIBA KK92 citations97
US7235456B2Jun 26, 2007
Method of making empty space in silicon
TOSHIBA KK38 citations96
US6630714B2Oct 7, 2003
Semiconductor device formed in semiconductor layer arranged on substrate with one of insulating film and cavity interposed between the substrate and the semiconductor layer
TOSHIBA KK47 citations96
US6395621B1May 28, 2002
Method of manufacturing a semiconductor device with oxide mediated epitaxial layer
TOSHIBA KK56 citations96
US6100132AAug 8, 2000
Method of deforming a trench by a thermal treatment
TOSHIBA KK72 citations96
US6018185AJan 25, 2000
Semiconductor device with element isolation film
TOSHIBA KK57 citations96
US5864161AJan 26, 1999
Semiconductor device and manufacturing method thereof
TOSHIBA KK84 citations96
US7507634B2Mar 24, 2009
Method for fabricating a localize SOI in bulk silicon substrate including changing first trenches formed in the substrate into unclosed empty space by applying heat treatment
TOSHIBA KK28 citations93
US7148543B2Dec 12, 2006
Semiconductor chip which combines bulk and SOI regions and separates same with plural isolation regions
TOSHIBA KK16 citations93
US7018904B2Mar 28, 2006
Semiconductor chip having multiple functional blocks integrated in a single chip and method for fabricating the same
TOSHIBA KK17 citations93
US6979846B2Dec 27, 2005
Semiconductor device and manufacturing method thereof
TOSHIBA KK31 citations93
US6903025B2Jun 7, 2005
Method of purging semiconductor manufacturing apparatus and method of manufacturing semiconductor device
TOSHIBA KK29 citations93
US6552380B1Apr 22, 2003
Semiconductor device and manufacturing method thereof
TOSHIBA KK28 citations93
US6232641B1May 15, 2001
Semiconductor apparatus having elevated source and drain structure and manufacturing method therefor
TOSHIBA KK43 citations93
US6207591B1Mar 27, 2001
Method and equipment for manufacturing semiconductor device
TOSHIBA KK41 citations93
US6924518B2Aug 2, 2005
Semiconductor device and method of manufacturing the same
TOSHIBA KK27 citations92
US6906384B2Jun 14, 2005
Semiconductor device having one of patterned SOI and SON structure
TOSHIBA KK44 citations92
US6744104B1Jun 1, 2004
Semiconductor integrated circuit including insulated gate field effect transistor and method of manufacturing the same
TOSHIBA KK42 citations92
US6600189B1Jul 29, 2003
Semiconductor device and semiconductor device manufacturing method
TOSHIBA KK25 citations92
US6362511B1Mar 26, 2002
MIS-type semiconductor device having a multi-portion gate electrode
TOSHIBA KK32 citations92
US9257552B2Feb 9, 2016
Semiconductor device and method of manufacturing same
TOSHIBA KK7 citations84
US7989856B2Aug 2, 2011
Fin transistor
TOSHIBA KK17 citations84
US7829948B2Nov 9, 2010
Nonvolatile semiconductor memory
TOSHIBA KK8 citations84
US7602013B2Oct 13, 2009
Semiconductor device with recessed channel
TOSHIBA KK12 citations84
US7537978B2May 26, 2009
Semiconductor device and manufacturing method thereof
TOSHIBA KK8 citations84
US7459748B2Dec 2, 2008
Semiconductor memory device
TOSHIBA KK17 citations84
US7372086B2May 13, 2008
Semiconductor device including MOSFET and isolation region for isolating the MOSFET
TOSHIBA KK17 citations84
US7294562B2Nov 13, 2007
Semiconductor substrate, method of manufacturing the same, semiconductor device, and method of manufacturing the same
TOSHIBA KK12 citations84
US6794713B2Sep 21, 2004
Semiconductor device and method of manufacturing the same including a dual layer raised source and drain
TOSHIBA KK14 citations84
US8742391B2Jun 3, 2014
Non-volatile semiconductor memory
TOSHIBA KK8 citations83
US5598025AJan 28, 1997
Semiconductor device comprises an impurity layer having boron ions in the form of clusters of icosahedron structure
TOSHIBA KK17 citations81
US7982259B2Jul 19, 2011
Nonvolatile semiconductor memory
TOSHIBA KK6 citations74
US7525154B2Apr 28, 2009
Semiconductor substrate, manufacturing method therefor, and semiconductor device
TOSHIBA KK7 citations74
US7285825B2Oct 23, 2007
Element formation substrate for forming semiconductor device
TOSHIBA KK6 citations74
US7265017B2Sep 4, 2007
Method for manufacturing partial SOI substrates
TOSHIBA KK5 citations74
US7208353B2Apr 24, 2007
Semiconductor device and manufacturing method thereof
TOSHIBA KK5 citations74
US7187035B2Mar 6, 2007
Semiconductor device comprising multiple layers with trenches formed on a semiconductor substrate
TOSHIBA KK9 citations74
US7122864B2Oct 17, 2006
Semiconductor substrate having a partial SOI structure, method of manufacturing the same, a semiconductor device having a partial SOI structure, and method of manufacturing the same
TOSHIBA KK9 citations74
MIZUSHIMA ICHIRO
2 patentsFUKUZUMI YOSHIAKI
1 patentICHIGE MASAYUKI
1 patentShowing the top 50 of 103 patents by PatentIndex Score.