Inventor
SAKAI KAORU
JP50 patents
⚠️ This page may combine multiple inventors who share the name “SAKAI KAORU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
17 patentsUS7020350B2Mar 28, 2006
Image alignment method, comparative inspection method, and comparative inspection device for comparative inspections
HITACHI LTD42 citations96
US6799130B2Sep 28, 2004
Inspection method and its apparatus, inspection system
HITACHI LTD56 citations96
US7142708B2Nov 28, 2006
Defect detection method and its apparatus
HITACHI LTD31 citations93
US7127126B2Oct 24, 2006
Image alignment method, comparative inspection method, and comparative inspection device for comparative inspections
HITACHI LTD29 citations93
US6927847B2Aug 9, 2005
Method and apparatus for inspecting pattern defects
HITACHI LTD24 citations93
US6879392B2Apr 12, 2005
Method and apparatus for inspecting defects
HITACHI LTD19 citations93
US6975391B1Dec 13, 2005
Method and apparatus for non-destructive testing
HITACHI LTD16 citations92
US6950545B1Sep 27, 2005
Nondestructive inspection method and apparatus
HITACHI LTD30 citations91
US6831995B1Dec 14, 2004
Method for detecting a defect in a pixel of an electrical display unit and a method for manufacturing an electrical display unit
HITACHI LTD40 citations90
US7333677B2Feb 19, 2008
Image alignment method, comparative inspection method, and comparative inspection device for comparative inspections
HITACHI LTD12 citations84
US7330248B2Feb 12, 2008
Method and apparatus for inspecting defects
HITACHI LTD15 citations84
US7869966B2Jan 11, 2011
Inspection method and its apparatus, inspection system
HITACHI LTD6 citations74
US7110105B2Sep 19, 2006
Method and apparatus for inspecting pattern defects
HITACHI LTD10 citations74
US7215807B2May 8, 2007
Nondestructive inspection method and apparatus
HITACHI LTD7 citations72
US7903249B2Mar 8, 2011
Method and apparatus for inspecting pattern defects
HITACHI LTD3 citations63
US7711178B2May 4, 2010
Pattern inspection method and its apparatus
HITACHI LTD5 citations63
US7489395B2Feb 10, 2009
Method and apparatus for inspecting pattern defects
HITACHI LTD0 citations52
HITACHI HIGH TECH CORP
12 patentsUS7388979B2Jun 17, 2008
Method and apparatus for inspecting pattern defects
HITACHI HIGH TECH CORP136 citations99
US6900888B2May 31, 2005
Method and apparatus for inspecting a pattern formed on a substrate
HITACHI HIGH TECH CORP38 citations96
US8005292B2Aug 23, 2011
Method and apparatus for inspecting pattern defects
HITACHI HIGH TECH CORP17 citations93
US7848563B2Dec 7, 2010
Method and apparatus for inspecting a defect of a pattern
HITACHI HIGH TECH CORP18 citations93
US7792352B2Sep 7, 2010
Method and apparatus for inspecting pattern defects
HITACHI HIGH TECH CORP17 citations93
US7664608B2Feb 16, 2010
Defect inspection method and apparatus
HITACHI HIGH TECH CORP37 citations93
US7433508B2Oct 7, 2008
Pattern inspection method and its apparatus
HITACHI HIGH TECH CORP21 citations93
US7949178B2May 24, 2011
Pattern inspection method and its apparatus
HITACHI HIGH TECH CORP7 citations84
US7620232B2Nov 17, 2009
Method and apparatus for pattern inspection
HITACHI HIGH TECH CORP13 citations84
US8824774B2Sep 2, 2014
Method and apparatus for inspecting patterns formed on a substrate
HITACHI HIGH TECH CORP4 citations73
US8755041B2Jun 17, 2014
Defect inspection method and apparatus
HITACHI HIGH TECH CORP3 citations63
US7646477B2Jan 12, 2010
Method and apparatus for inspecting a pattern formed on a substrate
HITACHI HIGH TECH CORP4 citations63
SAKAI KAORU
8 patentsUS8275190B2Sep 25, 2012
Method and apparatus for inspecting pattern defects
SAKAI KAORU13 citations92
US8639019B2Jan 28, 2014
Method and apparatus for inspecting pattern defects
SAKAI KAORU6 citations84
US8467594B2Jun 18, 2013
Method and apparatus for inspecting patterns formed on a substrate
SAKAI KAORU6 citations84
US8340395B2Dec 25, 2012
Defect inspection method and apparatus therefor
SAKAI KAORU12 citations84
US8270700B2Sep 18, 2012
Method and apparatus for pattern inspection
SAKAI KAORU3 citations63
US8090187B2Jan 3, 2012
Pattern inspection method and its apparatus
SAKAI KAORU3 citations62
US8737718B2May 27, 2014
Apparatus and method for inspecting defect
SAKAI KAORU1 citations51
US8216044B1Jul 10, 2012
Method and apparatus for calculating game outcomes
SAKAI KAORU0 citations42