P

Inventor

BRUNFELD ANDREI

US22 patents
⚠️ This page may combine multiple inventors who share the name “BRUNFELD ANDREI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

XYRATEX TECH LTD

8 patents
US7671978B2Mar 2, 2010

Scatterometer-interferometer and method for detecting and distinguishing characteristics of surface artifacts

XYRATEX TECH LTD9 citations84
US7330277B2Feb 12, 2008

Resonant ellipsometer and method for determining ellipsometric parameters of a surface

XYRATEX TECH LTD14 citations84
US7214932B2May 8, 2007

Resonator method and system for distinguishing characteristics of surface features or contaminants

XYRATEX TECH LTD17 citations84
US7193725B2Mar 20, 2007

Method and system for optical measurement via a resonator having a non-uniform phase profile

XYRATEX TECH LTD12 citations84
US7102740B2Sep 5, 2006

Method and system for determining surface feature characteristics using slit detectors

XYRATEX TECH LTD14 citations84
US7022978B2Apr 4, 2006

Method and apparatus including in-resonator imaging lens for improving resolution of a resonator-enhanced optical system

XYRATEX TECH LTD14 citations84
US7220955B2May 22, 2007

Three-dimensional imaging resonator and method therefor

XYRATEX TECH LTD5 citations62
US7294825B2Nov 13, 2007

Fabry-perot resonator apparatus and method including an in-resonator polarizing element

XYRATEX TECH LTD0 citations41

BROWN & SHARPE SURFACE INSPECT

4 patents
US6294793B1Sep 25, 2001

High speed optical inspection apparatus for a transparent disk using gaussian distribution analysis and method therefor

BROWN & SHARPE SURFACE INSPECT100 citations95
US6262432B1Jul 17, 2001

High speed surface inspection optical apparatus for a reflective disk using gaussian distribution analysis and method therefor

BROWN & SHARPE SURFACE INSPECT27 citations90
US6252242B1Jun 26, 2001

High speed optical inspection apparatus using Gaussian distribution analysis and method therefore

BROWN & SHARPE SURFACE INSPECT20 citations90
US6255666B1Jul 3, 2001

High speed optical inspection apparatus for a large transparent flat panel using gaussian distribution analysis and method therefor

BROWN & SHARPE SURFACE INSPECT1 citations49

DISPLAY INSPECTION SYSTEMS INC

2 patents
US5459576AOct 17, 1995

Differential phase contrast inspection system

DISPLAY INSPECTION SYSTEMS INC23 citations90
US5638175AJun 10, 1997

Differential phase contrast inspection system with multiple detectors

DISPLAY INSPECTION SYSTEMS INC9 citations71

BLUESHIFT BIOTECHNOLOGIES INC

2 patents
US7576862B2Aug 18, 2009

Measuring time dependent fluorescence

BLUESHIFT BIOTECHNOLOGIES INC21 citations89
US7812956B2Oct 12, 2010

Time dependent fluorescence measurements

BLUESHIFT BIOTECHNOLOGIES INC5 citations60

BEYOND 3 INC

1 patent
US6879421B2Apr 12, 2005

Method and system for performing swept-wavelength measurements within an optical system incorporating a reference resonator

BEYOND 3 INC40 citations92

(unassigned)

1 patent
US6629772B2Oct 7, 2003

Method and apparatus for illumination and entertainment by light emitted from a guide via scattering

38 citations92

ORBOTECH LTD

1 patent
US7253891B2Aug 7, 2007

Method and apparatus for simultaneous 2-D and topographical inspection

ORBOTECH LTD29 citations91

CROMWELL EVAN FRANCIS

1 patent
US7170605B2Jan 30, 2007

Active sensor and method for optical illumination and detection

CROMWELL EVAN FRANCIS30 citations86

AMSYS LTD

1 patent
US5189489AFeb 23, 1993

Interferometric measurement device with non stabilized light source

AMSYS LTD14 citations69

BRUNFELD ANDREI

1 patent
US8436997B2May 7, 2013

Optical inspection system with polarization isolation of detection system reflections

BRUNFELD ANDREI2 citations56