P

Inventor

KIKUIRI NOBUTAKA

JP43 patents
⚠️ This page may combine multiple inventors who share the name “KIKUIRI NOBUTAKA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NUFLARE TECHNOLOGY INC

24 patents
US10572995B2Feb 25, 2020

Inspection method and inspection apparatus

NUFLARE TECHNOLOGY INC13 citations86
US10281415B2May 7, 2019

Pattern inspection method and pattern inspection apparatus

NUFLARE TECHNOLOGY INC9 citations84
US9869650B2Jan 16, 2018

Pattern inspection apparatus

NUFLARE TECHNOLOGY INC7 citations84
US10777384B2Sep 15, 2020

Multiple beam image acquisition apparatus and multiple beam image acquisition method

NUFLARE TECHNOLOGY INC3 citations73
US10629406B2Apr 21, 2020

Optical system adjustment method of image acquisition apparatus

NUFLARE TECHNOLOGY INC3 citations73
US10026011B2Jul 17, 2018

Mask inspection apparatus, mask evaluation method and mask evaluation system

NUFLARE TECHNOLOGY INC6 citations73
US9728373B2Aug 8, 2017

Pattern inspection apparatus and pattern inspection method

NUFLARE TECHNOLOGY INC4 citations73
US9575010B2Feb 21, 2017

Inspection apparatus and inspection method

NUFLARE TECHNOLOGY INC6 citations73
US9196033B2Nov 24, 2015

Inspection sensitivity evaluation method

NUFLARE TECHNOLOGY INC4 citations73
US8861832B2Oct 14, 2014

Inspection system and method

NUFLARE TECHNOLOGY INC4 citations73
US9922415B2Mar 20, 2018

Inspection method, inspection apparatus, and inspection system

NUFLARE TECHNOLOGY INC6 citations71
US10504219B2Dec 10, 2019

Inspection apparatus and inspection method

NUFLARE TECHNOLOGY INC1 citations63
US9086388B2Jul 21, 2015

Pattern evaluation method and apparatus

NUFLARE TECHNOLOGY INC2 citations63
US9165355B1Oct 20, 2015

Inspection method

NUFLARE TECHNOLOGY INC2 citations60
US9691143B2Jun 27, 2017

Inspection apparatus and inspection apparatus system

NUFLARE TECHNOLOGY INC1 citations52
US9235883B2Jan 12, 2016

Inspection system and method

NUFLARE TECHNOLOGY INC1 citations52
US10127648B2Nov 13, 2018

Pattern inspection apparatus and pattern inspection method

NUFLARE TECHNOLOGY INC0 citations42
US10094791B2Oct 9, 2018

Pattern inspection apparatus

NUFLARE TECHNOLOGY INC0 citations42
US9811896B2Nov 7, 2017

Measuring apparatus

NUFLARE TECHNOLOGY INC0 citations42
US9659361B2May 23, 2017

Measuring apparatus that generates positional deviation distribution of a pattern on a target object

NUFLARE TECHNOLOGY INC0 citations42
US9626755B2Apr 18, 2017

Mask inspection apparatus and mask inspection method

NUFLARE TECHNOLOGY INC0 citations42
US9530202B2Dec 27, 2016

Inspection apparatus and inspection method

NUFLARE TECHNOLOGY INC0 citations42
US9116136B2Aug 25, 2015

Inspection method and system

NUFLARE TECHNOLOGY INC0 citations42
US9140654B2Sep 22, 2015

Inspection apparatus

NUFLARE TECHNOLOGY INC0 citations40

TOSHIBA KK

15 patents

KATAOKA AKIRA

1 patent

MATSUMOTO EIJI

1 patent

ISOMURA IKUNAO

1 patent

TSUCHIYA HIDEO

1 patent