Inventor
SHERRY JEFFREY
US17 patents
Patents
17 patentsUS10725069B1Jul 28, 2020
Integrated circuit contactor for testing ICs and method of construction
JOHNSTECH INT CORP13 citations83
US10794933B1Oct 6, 2020
Integrated circuit contact test apparatus with and method of construction
JOHNSTECH INT CORP6 citations81
US10274515B1Apr 30, 2019
Waveguide integrated testing
JOHNSTECH INT CORP5 citations80
US9500673B2Nov 22, 2016
Electrically conductive kelvin contacts for microcircuit tester
JOHNSTECH INT CORP7 citations77
US11293968B2Apr 5, 2022
Integrated circuit testing for integrated circuits with antennas
JOHNSTECH INT CORP4 citations72
US11002760B1May 11, 2021
High isolation housing for testing integrated circuits
JOHNSTECH INT CORP4 citations71
US11360117B1Jun 14, 2022
Waveguide integrated circuit testing
JOHNSTECH INT CORP1 citations69
US10698000B1Jun 30, 2020
Waveguide integrated testing
JOHNSTECH INT CORP1 citations69
US9476936B1Oct 25, 2016
Thermal management for microcircuit testing system
JOHNSTECH INT CORP6 citations67
US9696347B2Jul 4, 2017
Testing apparatus and method for microcircuit and wafer level IC testing
JOHNSTECH INT CORP2 citations66
US11183783B2Nov 23, 2021
High isolation contactor with test pin and housing for integrated circuit testing
JOHNSTECH INT CORP0 citations62
US11209458B2Dec 28, 2021
Integrated circuit contactor for testing ICs and method of construction
JOHNSTECH INT CORP0 citations60
US11307232B1Apr 19, 2022
Waveguide integrated circuit testing
JOHNSTECH INT CORP1 citations59
US10928423B2Feb 23, 2021
Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings
JOHNSTECH INT CORP0 citations56
US11467183B2Oct 11, 2022
Integrated circuit contact test apparatus with and method of construction
JOHNSTECH INT CORP0 citations52
US10686269B2Jun 16, 2020
High isolation contactor with test pin and housing for integrated circuit testing
JOHNSTECH INT CORP0 citations51
US10067164B2Sep 4, 2018
Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings
JOHNSTECH INT CORP0 citations45