Inventor
GUO DECHAO
US234 patents
⚠️ This page may combine multiple inventors who share the name “GUO DECHAO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
25 patentsUS9318581B1Apr 19, 2016
Forming wrap-around silicide contact on finFET
IBM82 citations98
US11069684B1Jul 20, 2021
Stacked field effect transistors with reduced coupling effect
IBM49 citations95
US10797163B1Oct 6, 2020
Leakage control for gate-all-around field-effect transistor devices
IBM26 citations94
US9721848B1Aug 1, 2017
Cutting fins and gates in CMOS devices
IBM32 citations94
US9397197B1Jul 19, 2016
Forming wrap-around silicide contact on finFET
IBM28 citations94
US9773893B1Sep 26, 2017
Forming a sacrificial liner for dual channel devices
IBM11 citations93
US9704754B1Jul 11, 2017
Self-aligned spacer for cut-last transistor fabrication
IBM13 citations93
US8928086B2Jan 6, 2015
Strained finFET with an electrically isolated channel
IBM19 citations93
US9922984B1Mar 20, 2018
Threshold voltage modulation through channel length adjustment
IBM10 citations92
US9157887B2Oct 13, 2015
Graphene sensor
IBM19 citations92
US9960254B1May 1, 2018
Replacement metal gate scheme with self-alignment gate for vertical field effect transistors
IBM22 citations91
US11201153B2Dec 14, 2021
Stacked field effect transistor with wrap-around contacts
IBM9 citations86
US10510892B2Dec 17, 2019
Forming a sacrificial liner for dual channel devices
IBM3 citations84
US10096713B1Oct 9, 2018
FinFET with sigma recessed source/drain and un-doped buffer layer epitaxy for uniform junction formation
IBM7 citations84
US9978750B1May 22, 2018
Low resistance source/drain contacts for complementary metal oxide semiconductor (CMOS) devices
IBM11 citations84
US9922983B1Mar 20, 2018
Threshold voltage modulation through channel length adjustment
IBM10 citations84
US9412641B1Aug 9, 2016
FinFET having controlled dielectric region height
IBM10 citations84
US9390976B2Jul 12, 2016
Method of forming epitaxial buffer layer for finFET source and drain junction leakage reduction
IBM8 citations84
US9190520B2Nov 17, 2015
Strained finFET with an electrically isolated channel
IBM15 citations84
US9171954B2Oct 27, 2015
FinFET structure and method to adjust threshold voltage in a FinFET structure
IBM9 citations84
US8940595B2Jan 27, 2015
Faceted intrinsic epitaxial buffer layer for reducing short channel effects while maximizing channel stress levels
IBM8 citations84
US8853788B2Oct 7, 2014
Replacement gate electrode with planar work function material layers
IBM6 citations84
US8741700B1Jun 3, 2014
Non-volatile graphene nanomechanical switch
IBM8 citations84
US8735947B1May 27, 2014
Non-volatile graphene nanomechanical switch
IBM12 citations84
US8354313B2Jan 15, 2013
Method to optimize work function in complementary metal oxide semiconductor (CMOS) structures
IBM8 citations84
GUO DECHAO
13 patentsUS8900935B2Dec 2, 2014
Deposition on a nanowire using atomic layer deposition
GUO DECHAO347 citations99
US9142660B2Sep 22, 2015
Method to fabricate a vertical transistor having an asymmetric gate with two conductive layers having different work functions
GUO DECHAO17 citations93
US8084346B1Dec 27, 2011
Replacement metal gate method
GUO DECHAO26 citations93
US9068936B2Jun 30, 2015
Graphene sensor
GUO DECHAO11 citations84
US8927432B2Jan 6, 2015
Continuously scalable width and height semiconductor fins
GUO DECHAO8 citations84
US8866214B2Oct 21, 2014
Vertical transistor having an asymmetric gate
GUO DECHAO13 citations84
US8686514B2Apr 1, 2014
Multiple threshold voltages in field effect transistor devices
GUO DECHAO9 citations84
US8610172B2Dec 17, 2013
FETs with hybrid channel materials
GUO DECHAO17 citations84
US8569135B2Oct 29, 2013
Replacement gate electrode with planar work function material layers
GUO DECHAO10 citations84
US8519454B2Aug 27, 2013
Structure and process for metal fill in replacement metal gate integration
GUO DECHAO9 citations84
US8513081B2Aug 20, 2013
Carbon implant for workfunction adjustment in replacement gate transistor
GUO DECHAO12 citations84
US8455365B2Jun 4, 2013
Self-aligned carbon electronics with embedded gate electrode
GUO DECHAO9 citations84
US8435878B2May 7, 2013
Field effect transistor device and fabrication
GUO DECHAO5 citations84
CAI MING
6 patentsUS8513131B2Aug 20, 2013
Fin field effect transistor with variable channel thickness for threshold voltage tuning
CAI MING39 citations94
US8697523B2Apr 15, 2014
Integration of SMT in replacement gate FINFET process flow
CAI MING25 citations92
US8648438B2Feb 11, 2014
Structure and method to form passive devices in ETSOI process flow
CAI MING19 citations92
US8658505B2Feb 25, 2014
Embedded stressors for multigate transistor devices
CAI MING9 citations84
US8530315B2Sep 10, 2013
finFET with fully silicided gate
CAI MING9 citations84
US8470678B2Jun 25, 2013
Tensile stress enhancement of nitride film for stressed channel field effect transistor fabrication
CAI MING8 citations84
CAO QING
2 patentsYUAN JUN
1 patentWONG KEITH KWONG HON
1 patentFRANK MARTIN M
1 patentBRYANT ANDRES
1 patentShowing the top 50 of 234 patents by PatentIndex Score.