P

Inventor

YEH CHUN-CHEN

US371 patents
⚠️ This page may combine multiple inventors who share the name “YEH CHUN-CHEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

33 patents
US9923055B1Mar 20, 2018

Inner spacer for nanosheet transistors

IBM49 citations98
US9716170B1Jul 25, 2017

Reduced capacitance in vertical transistors by preventing excessive overlap between the gate and the source/drain

IBM46 citations98
US9711618B1Jul 18, 2017

Fabrication of vertical field effect transistor structure with controlled gate length

IBM43 citations98
US8679902B1Mar 25, 2014

Stacked nanowire field effect transistor

IBM70 citations98
US11069684B1Jul 20, 2021

Stacked field effect transistors with reduced coupling effect

IBM49 citations95
US10002939B1Jun 19, 2018

Nanosheet transistors having thin and thick gate dielectric material

IBM22 citations94
US9929246B1Mar 27, 2018

Forming air-gap spacer for vertical field effect transistor

IBM24 citations94
US9793395B1Oct 17, 2017

Vertical vacuum channel transistor

IBM24 citations94
US9741716B1Aug 22, 2017

Forming vertical and horizontal field effect transistors on the same substrate

IBM43 citations94
US8951870B2Feb 10, 2015

Forming strained and relaxed silicon and silicon germanium fins on the same wafer

IBM39 citations94
US9812443B1Nov 7, 2017

Forming vertical transistors and metal-insulator-metal capacitors on the same chip

IBM17 citations93
US9608069B1Mar 28, 2017

Self aligned epitaxial based punch through control

IBM20 citations93
US9455317B1Sep 27, 2016

Nanowire semiconductor device including lateral-etch barrier region

IBM14 citations93
US9324830B2Apr 26, 2016

Self-aligned contact process enabled by low temperature

IBM12 citations93
US9190466B2Nov 17, 2015

Independent gate vertical FinFET structure

IBM19 citations93
US9105742B1Aug 11, 2015

Dual epitaxial process including spacer adjustment

IBM23 citations93
US8841178B1Sep 23, 2014

Strained silicon nFET and silicon germanium pFET on same wafer

IBM27 citations93
US8815670B2Aug 26, 2014

Preventing Fin erosion and limiting EPI overburden in FinFET structures by composite hardmask

IBM29 citations93
US8815668B2Aug 26, 2014

Preventing FIN erosion and limiting Epi overburden in FinFET structures by composite hardmask

IBM21 citations93
US8673729B1Mar 18, 2014

finFET eDRAM strap connection structure

IBM18 citations93
US11201153B2Dec 14, 2021

Stacked field effect transistor with wrap-around contacts

IBM9 citations86
US10840329B1Nov 17, 2020

Nanosheet transistor having improved bottom isolation

IBM18 citations86
US9870952B1Jan 16, 2018

Formation of VFET and finFET

IBM17 citations86
US11164793B2Nov 2, 2021

Reduced source/drain coupling for CFET

IBM6 citations84
US10566438B2Feb 18, 2020

Nanosheet transistor with dual inner airgap spacers

IBM5 citations84
US10546942B2Jan 28, 2020

Nanosheet transistor with optimized junction and cladding defectivity control

IBM7 citations84
US10468525B1Nov 5, 2019

VFET CMOS dual epitaxy integration

IBM7 citations84
US10396208B2Aug 27, 2019

Vertical transistors with improved top source/drain junctions

IBM6 citations84
US10381273B1Aug 13, 2019

Vertically stacked multi-channel transistor structure

IBM8 citations84
US10361315B1Jul 23, 2019

Method and apparatus of fabricating source and drain epitaxy for vertical field effect transistor

IBM9 citations84
US10347739B2Jul 9, 2019

Extended contact area using undercut silicide extensions

IBM5 citations84
US10347719B2Jul 9, 2019

Nanosheet transistors on bulk material

IBM5 citations84
US10332961B2Jun 25, 2019

Inner spacer for nanosheet transistors

IBM7 citations84

ST MICROELECTRONICS INC

6 patents

GLOBALFOUNDRIES INC

6 patents

CAI MING

3 patents

BASKER VEERARAGHAVAN S

2 patents

Showing the top 50 of 371 patents by PatentIndex Score.