Inventor
YEH CHUN-CHEN
US371 patents
⚠️ This page may combine multiple inventors who share the name “YEH CHUN-CHEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
33 patentsUS9923055B1Mar 20, 2018
Inner spacer for nanosheet transistors
IBM49 citations98
US9716170B1Jul 25, 2017
Reduced capacitance in vertical transistors by preventing excessive overlap between the gate and the source/drain
IBM46 citations98
US9711618B1Jul 18, 2017
Fabrication of vertical field effect transistor structure with controlled gate length
IBM43 citations98
US8679902B1Mar 25, 2014
Stacked nanowire field effect transistor
IBM70 citations98
US11069684B1Jul 20, 2021
Stacked field effect transistors with reduced coupling effect
IBM49 citations95
US10002939B1Jun 19, 2018
Nanosheet transistors having thin and thick gate dielectric material
IBM22 citations94
US9929246B1Mar 27, 2018
Forming air-gap spacer for vertical field effect transistor
IBM24 citations94
US9793395B1Oct 17, 2017
Vertical vacuum channel transistor
IBM24 citations94
US9741716B1Aug 22, 2017
Forming vertical and horizontal field effect transistors on the same substrate
IBM43 citations94
US8951870B2Feb 10, 2015
Forming strained and relaxed silicon and silicon germanium fins on the same wafer
IBM39 citations94
US9812443B1Nov 7, 2017
Forming vertical transistors and metal-insulator-metal capacitors on the same chip
IBM17 citations93
US9608069B1Mar 28, 2017
Self aligned epitaxial based punch through control
IBM20 citations93
US9455317B1Sep 27, 2016
Nanowire semiconductor device including lateral-etch barrier region
IBM14 citations93
US9324830B2Apr 26, 2016
Self-aligned contact process enabled by low temperature
IBM12 citations93
US9190466B2Nov 17, 2015
Independent gate vertical FinFET structure
IBM19 citations93
US9105742B1Aug 11, 2015
Dual epitaxial process including spacer adjustment
IBM23 citations93
US8841178B1Sep 23, 2014
Strained silicon nFET and silicon germanium pFET on same wafer
IBM27 citations93
US8815670B2Aug 26, 2014
Preventing Fin erosion and limiting EPI overburden in FinFET structures by composite hardmask
IBM29 citations93
US8815668B2Aug 26, 2014
Preventing FIN erosion and limiting Epi overburden in FinFET structures by composite hardmask
IBM21 citations93
US8673729B1Mar 18, 2014
finFET eDRAM strap connection structure
IBM18 citations93
US11201153B2Dec 14, 2021
Stacked field effect transistor with wrap-around contacts
IBM9 citations86
US10840329B1Nov 17, 2020
Nanosheet transistor having improved bottom isolation
IBM18 citations86
US9870952B1Jan 16, 2018
Formation of VFET and finFET
IBM17 citations86
US11164793B2Nov 2, 2021
Reduced source/drain coupling for CFET
IBM6 citations84
US10566438B2Feb 18, 2020
Nanosheet transistor with dual inner airgap spacers
IBM5 citations84
US10546942B2Jan 28, 2020
Nanosheet transistor with optimized junction and cladding defectivity control
IBM7 citations84
US10468525B1Nov 5, 2019
VFET CMOS dual epitaxy integration
IBM7 citations84
US10396208B2Aug 27, 2019
Vertical transistors with improved top source/drain junctions
IBM6 citations84
US10381273B1Aug 13, 2019
Vertically stacked multi-channel transistor structure
IBM8 citations84
US10361315B1Jul 23, 2019
Method and apparatus of fabricating source and drain epitaxy for vertical field effect transistor
IBM9 citations84
US10347739B2Jul 9, 2019
Extended contact area using undercut silicide extensions
IBM5 citations84
US10347719B2Jul 9, 2019
Nanosheet transistors on bulk material
IBM5 citations84
US10332961B2Jun 25, 2019
Inner spacer for nanosheet transistors
IBM7 citations84
ST MICROELECTRONICS INC
6 patentsUS9502518B2Nov 22, 2016
Multi-channel gate-all-around FET
ST MICROELECTRONICS INC46 citations98
US9748352B2Aug 29, 2017
Multi-channel gate-all-around FET
ST MICROELECTRONICS INC28 citations94
US9391200B2Jul 12, 2016
FinFETs having strained channels, and methods of fabricating finFETs having strained channels
ST MICROELECTRONICS INC27 citations94
US9202920B1Dec 1, 2015
Methods for forming vertical and sharp junctions in finFET structures
ST MICROELECTRONICS INC42 citations94
US9082852B1Jul 14, 2015
LDMOS FinFET device using a long channel region and method of manufacture
ST MICROELECTRONICS INC32 citations94
US9202919B1Dec 1, 2015
FinFETs and techniques for controlling source and drain junction profiles in finFETs
ST MICROELECTRONICS INC21 citations93
GLOBALFOUNDRIES INC
6 patentsUS10269983B2Apr 23, 2019
Stacked nanosheet field-effect transistor with air gap spacers
GLOBALFOUNDRIES INC20 citations94
US10249538B1Apr 2, 2019
Method of forming vertical field effect transistors with different gate lengths and a resulting structure
GLOBALFOUNDRIES INC22 citations94
US10103247B1Oct 16, 2018
Vertical transistor having buried contact, and contacts using work function metals and silicides
GLOBALFOUNDRIES INC28 citations94
US10014370B1Jul 3, 2018
Air gap adjacent a bottom source/drain region of vertical transistor device
GLOBALFOUNDRIES INC24 citations94
US9935018B1Apr 3, 2018
Methods of forming vertical transistor devices with different effective gate lengths
GLOBALFOUNDRIES INC33 citations94
US9960271B1May 1, 2018
Method of forming vertical field effect transistors with different threshold voltages and the resulting integrated circuit structure
GLOBALFOUNDRIES INC19 citations86
CAI MING
3 patentsUS8513131B2Aug 20, 2013
Fin field effect transistor with variable channel thickness for threshold voltage tuning
CAI MING39 citations94
US8697523B2Apr 15, 2014
Integration of SMT in replacement gate FINFET process flow
CAI MING25 citations92
US8648438B2Feb 11, 2014
Structure and method to form passive devices in ETSOI process flow
CAI MING19 citations92
BASKER VEERARAGHAVAN S
2 patentsShowing the top 50 of 371 patents by PatentIndex Score.