Inventor
SAKAO MASATO
JP20 patents
⚠️ This page may combine multiple inventors who share the name “SAKAO MASATO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC CORP
19 patentsUS5940702AAug 17, 1999
Method for forming a cylindrical stacked capacitor in a semiconductor device
NEC CORP58 citations96
US5798544AAug 25, 1998
Semiconductor memory device having trench isolation regions and bit lines formed thereover
NEC CORP105 citations96
US5084419AJan 28, 1992
Method of manufacturing semiconductor device using chemical-mechanical polishing
NEC CORP61 citations96
US6483194B2Nov 19, 2002
Semiconductor device having capacitor and method thereof
NEC CORP21 citations92
US6031262AFeb 29, 2000
Semiconductor memory device having capacitor-over-bitline cell with multiple cylindrical storage electrode offset from node contact and process of fabrication thereof
NEC CORP25 citations92
US5759889AJun 2, 1998
Method for manufacturing semiconductor device incorporating DRAM section and logic circuit section
NEC CORP37 citations92
US5698467ADec 16, 1997
Method of manufacturing an insulation layer having a flat surface
NEC CORP20 citations92
US5508222AApr 16, 1996
Fabrication process for semiconductor device
NEC CORP40 citations92
US6350647B2Feb 26, 2002
Semiconductor memory device and manufacturing method of the same
NEC CORP14 citations84
US6184584B1Feb 6, 2001
Miniaturized contact in semiconductor substrate and method for forming the same
NEC CORP18 citations84
US6387752B1May 14, 2002
Semiconductor memory device and method of fabricating the same
NEC CORP7 citations73
US6229170B1May 8, 2001
Semiconductor memory cell
NEC CORP8 citations73
US5728616AMar 17, 1998
Method of making a semiconductor memory device with improved capacitor
NEC CORP13 citations73
US5652446AJul 29, 1997
Semiconductor memory device with improved capacitor
NEC CORP8 citations73
US5463236AOct 31, 1995
Semiconductor memory device having improved isolation structure among memory cells
NEC CORP17 citations73
US5466964ANov 14, 1995
Semiconductor device capable of increasing reliability
NEC CORP14 citations72
US6166425ADec 26, 2000
Semiconductor device having a resistance element with a reduced area
NEC CORP4 citations62
US5548157AAug 20, 1996
Semiconductor device capable of increasing reliability
NEC CORP4 citations61
US6022773AFeb 8, 2000
Method of making a semiconductor device
NEC CORP0 citations52