Inventor

PAI YUAN-CHI

TW23 patents

⚠️ This page may combine multiple inventors who share the name “PAI YUAN-CHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

PAI YUAN-CHI

UNITED MICROELECTRONICS CORP

Method of manufacturing complementary metal-oxide-semiconductor photosensitive device

Method of fabricating focusing and color-filtering structure for semiconductor light-sensitive device

Method of fabricating a complementary metal-oxide semiconductor sensor device

Processing flow of a complementary metal-oxide semiconductor color filter

Method of correcting overlay error

Photo-mask and method of manufacturing semiconductor structures by using the same

Asymmetry compensation method used in lithography overlay process

Method for manufacturing semiconductor device

Method for in-situ removing photoresist material

Method of manufacturing semiconductor device having gate metal

UNITED SEMICONDUCTOR XIAMEN CO LTD

Manufacturing method of contact structure

Reticle thermal expansion calibration method capable of improving sub-recipe

Semiconductor manufacturing process

Lithography film stack and lithography method

Method for aligning to a pattern on a wafer

Method for aligning to a pattern on a wafer

Photoresist coating method

(unassigned)

Focusing and color-filtering structure for semiconductor light-sensitive device

CHEN YI-TING

Overlay mark for multiple pre-layers and currently layer

UNITED MICROELECTRONICS CROP

Process for removing photoresist material

WU HUNG-YI

Photoresist removal method and patterning process utilizing the same

CHIANG YI-CHIH

Method of forming assist feature patterns

HUANG YONG-FA

Method for forming photoresist patterns