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Inventor
NEMOTO KAZUNORI
JP
5 patents
⚠️ This page may combine multiple inventors who share the name “NEMOTO KAZUNORI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
2 patents
US6611728B1
Aug 26, 2003
Inspection system and method for manufacturing electronic devices using the inspection system
HITACHI LTD
71 citations
95
US6539272B1
Mar 25, 2003
Electric device inspection method and electric device inspection system
HITACHI LTD
10 citations
72
HAYAKAWA KOICHI
1 patent
US8595666B2
Nov 26, 2013
Semiconductor defect classifying method, semiconductor defect classifying apparatus, and semiconductor defect classifying program
HAYAKAWA KOICHI
10 citations
81
NEMOTO KAZUNORI
1 patent
US8831899B2
Sep 9, 2014
Inspecting apparatus and an inspecting method
NEMOTO KAZUNORI
9 citations
79
HITACHI ASTEMO LTD
1 patent
US11808807B2
Nov 7, 2023
Semiconductor integrated circuit device and inspection method for semiconductor integrated circuit device
HITACHI ASTEMO LTD
0 citations
59