Inventor

CHANG CHIH-KUNG

TW36 patents

⚠️ This page may combine multiple inventors who share the name “CHANG CHIH-KUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CHANG CHIH-KUNG

TAIWAN SEMICONDUCTOR MFG CO LTD

Image sensor with improved near-infrared (NIR) radiation phase-detection autofocus (PDAF) performance

Semiconductor image sensor

Image sensor with improved near-infrared (NIR) radiation phase-detection autofocus (PDAF) performance

Image sensor with improved near-infrared (NIR) radiation phase-detection autofocus (PDAF) performance

Semiconductor image sensor

Semiconductor image sensor

Deep trench isolation for cross-talk reduction

Wavelength tunable narrow band filter

Wavelength tunable narrow band filter

Wave guide filter for semiconductor imaging devices

Wave guide filter for semiconductor imaging devices

Wave guide filter for semiconductor imaging devices

Multi-chip image sensor

Image sensor with scattering structure

Reduced cross-talk in color and infrared image sensor

Trench isolation structure for image sensors

TAIWAN SEMICONDUCTOR MFG

High efficiency color filter process to improve color balance in semiconductor array imaging devices

Image sensor fabrication method and structure

Rework procedure for the microlens element of a CMOS image sensor

Method for fabricating microelectronic product with attenuated bond pad corrosion

Color filter image array optoelectronic microelectronic fabrication with a planarizing layer formed upon a concave surfaced color filter region

Advance ridge structure for microlens gapless approach

Microlens structure for improved CMOS image sensor sensitivity

Method for fabricating microlens with lithographic process

Method to improve passivation openings by reflow of photoresist to eliminate tape residue

Image sensor fabrication method and structure

Material to improve image sensor yield during wafer sawing

Material to improve CMOS image sensor yield during wafer sawing

Method to monitor stepper lens quality in color filter process

Method for forming crack resistant planarizing layer within microelectronic fabrication

Microlens structure for image sensors

VISERA TECHNOLOGIES CO LTD

Solid-state imaging devices having light shielding partitions with variable dimensions

Solid-state imaging devices and methods of fabricating the same

WENG FU-TIEN

Image sensor

Chen hao-min

Color filter of illumination image sensor and method for fabricating the same

JIENG TAI INT ELECTRONIC CORP

Communication device