Inventor

MAYES IAN

GB2 patents

Patents

2 patents

US7446868B1Nov 4, 2008

Micro defects in semi-conductors

NANOMETRICS INC29 citations86

US7713404B2May 11, 2010

Monitoring apparatus and method for improving the accuracy and repeatability of electrochemical capacitance voltage (ECV) measurements

NANOMETRICS INC0 citations43