Inventor

KAJIHARA SEIJI

JP18 patents

⚠️ This page may combine multiple inventors who share the name “KAJIHARA SEIJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KAJIHARA SEIJI

KYUSHU INST TECHNOLOGY

Test vector generating method and test vector generating program of semiconductor logic circuit device

Method and apparatus of fault diagnosis for integrated logic circuits

Test pattern generation method for avoiding false testing in two-pattern testing for semiconductor integrated circuit

Test pattern generation device, fault detection system, test pattern generation method, program and recording medium

Fault detection system, generation circuit, and program

JAPAN SCIENCE & TECH AGENCY

Generating device, generating method, program and recording medium

Generating device, generating method, program and recording medium

Conversion device, conversion method, program, and recording medium

Conversion device, conversion method, program, and recording medium

Diagnostic device, diagnostic method, program, and recording medium

MIYASE KOHEI

Don&#39;t-care-bit identification method and don&#39;t-care-bit identification program

Target logic value determination method for unspecified bit in test vector for combinational circuit and non-transitory computer-readable medium

Generating device, generating method, and program

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD

Method for generating test pattern for semiconductor integrated circuit and method for testing semiconductor integrated circuit

Method for evaluating delay test quality

SATO YASUO

Semiconductor device, detection method and program

Fault detection system, acquisition apparatus, fault detection method, program, and non-transitory computer-readable medium

WEN XIAOQING

Test method and test program of semiconductor logic circuit device

Don't-care-bit identification method and don't-care-bit identification program