Inventor
JUNG WOO SIK
KR6 patents
⚠️ This page may combine multiple inventors who share the name “JUNG WOO SIK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SK HYNIX INC
4 patentsUS9714977B2Jul 25, 2017
Burn-in test system and method
SK HYNIX INC3 citations66
US12159681B2Dec 3, 2024
Test systems configured to perform test mode operations for multiple memory devices
SK HYNIX INC0 citations60
US10060969B2Aug 28, 2018
Test board unit and apparatus for testing a semiconductor chip including the same
SK HYNIX INC0 citations46
US9418760B2Aug 16, 2016
Integrated circuit and method for testing semiconductor devices using the same
SK HYNIX INC0 citations40