Inventor
TAL NOAM
IL24 patents
⚠️ This page may combine multiple inventors who share the name “TAL NOAM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INTEL CORP
11 patentsUS10341046B2Jul 2, 2019
Configurable constellation mapping to control spectral efficiency versus signal-to-noise ratio
INTEL CORP19 citations94
US9634795B2Apr 25, 2017
Configurable constellation mapping to control spectral efficiency versus signal-to-noise ratio
INTEL CORP9 citations84
US10491249B2Nov 26, 2019
Method and apparatus for self-interference cancelation in a full duplex network
INTEL CORP8 citations83
US11665040B2May 30, 2023
Configurable constellation mapping to control spectral efficiency versus signal-to-noise ratio
INTEL CORP0 citations62
US11463126B2Oct 4, 2022
Signaling method for interference group discovery in cable modems
INTEL CORP0 citations62
US11075713B2Jul 27, 2021
Configurable constellation mapping to control spectral efficiency versus signal-to-noise ratio
INTEL CORP0 citations62
US10848267B2Nov 24, 2020
Configurable constellation mapping to control spectral efficiency versus signal-to-noise ratio
INTEL CORP0 citations52
US10742264B2Aug 11, 2020
Signaling method for interference group discovery in cable modems
INTEL CORP0 citations52
US10158451B2Dec 18, 2018
Configurable constellation mapping to control spectral efficiency versus signal-to-noise ratio
INTEL CORP0 citations52
US8976904B2Mar 10, 2015
Automated erasure slicer threshold control and modification of symbol estimates to be erased
INTEL CORP0 citations51
US9170968B2Oct 27, 2015
Device, system and method of multi-channel processing
INTEL CORP0 citations35
NOVA LTD
5 patentsUS11763181B2Sep 19, 2023
Metrology and process control for semiconductor manufacturing
NOVA LTD3 citations68
US12321102B2Jun 3, 2025
Machine and deep learning methods for spectra-based metrology and process control
NOVA LTD0 citations59
US11815819B2Nov 14, 2023
Machine and deep learning methods for spectra-based metrology and process control
NOVA LTD0 citations59
US12236364B2Feb 25, 2025
Metrology and process control for semiconductor manufacturing
NOVA LTD0 citations58
US11874606B2Jan 16, 2024
System and method for controlling measurements of sample's parameters
NOVA LTD0 citations46
APPLIED MATERIALS ISRAEL LTD
3 patentsUS12469124B2Nov 11, 2025
Machine learning based yield prediction
APPLIED MATERIALS ISRAEL LTD0 citations42
US12561793B2Feb 24, 2026
Machine learning based examination for process monitoring
APPLIED MATERIALS ISRAEL LTD0 citations41
US12489020B2Dec 2, 2025
End-to-end measurement for semiconductor specimens
APPLIED MATERIALS ISRAEL LTD0 citations41