Inventor
ZUO JIANG-KAI
US103 patents
⚠️ This page may combine multiple inventors who share the name “ZUO JIANG-KAI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FREESCALE SEMICONDUCTOR INC
24 patentsUS7776700B2Aug 17, 2010
LDMOS device and method
FREESCALE SEMICONDUCTOR INC35 citations92
US7608513B2Oct 27, 2009
Dual gate LDMOS device fabrication methods
FREESCALE SEMICONDUCTOR INC30 citations92
US9614074B1Apr 4, 2017
Partial, self-biased isolation in semiconductor devices
FREESCALE SEMICONDUCTOR INC13 citations84
US9590097B2Mar 7, 2017
Semiconductor devices and related fabrication methods
FREESCALE SEMICONDUCTOR INC7 citations84
US9543454B1Jan 10, 2017
Diodes with multiple junctions
FREESCALE SEMICONDUCTOR INC6 citations84
US9508845B1Nov 29, 2016
LDMOS device with high-potential-biased isolation ring
FREESCALE SEMICONDUCTOR INC14 citations84
US7915704B2Mar 29, 2011
Schottky diode
FREESCALE SEMICONDUCTOR INC8 citations84
US7910991B2Mar 22, 2011
Dual gate lateral diffused MOS transistor
FREESCALE SEMICONDUCTOR INC9 citations84
US7256471B2Aug 14, 2007
Antifuse element and electrically redundant antifuse array for controlled rupture location
FREESCALE SEMICONDUCTOR INC12 citations84
US7239543B2Jul 3, 2007
Magnetic tunnel junction current sensors
FREESCALE SEMICONDUCTOR INC11 citations84
US7795674B2Sep 14, 2010
Dual gate LDMOS devices
FREESCALE SEMICONDUCTOR INC9 citations83
US7700405B2Apr 20, 2010
Microelectronic assembly with improved isolation voltage performance and a method for forming the same
FREESCALE SEMICONDUCTOR INC10 citations83
US8049299B2Nov 1, 2011
Antifuses with curved breakdown regions
FREESCALE SEMICONDUCTOR INC9 citations82
US7700417B2Apr 20, 2010
Methods for forming cascode current mirrors
FREESCALE SEMICONDUCTOR INC6 citations74
US7393752B2Jul 1, 2008
Semiconductor devices and method of fabrication
FREESCALE SEMICONDUCTOR INC6 citations74
US9871135B2Jan 16, 2018
Semiconductor device and method of making
FREESCALE SEMICONDUCTOR INC5 citations73
US9728600B2Aug 8, 2017
Partially biased isolation in semiconductor devices
FREESCALE SEMICONDUCTOR INC5 citations73
US9680011B2Jun 13, 2017
Self-adjusted isolation bias in semiconductor devices
FREESCALE SEMICONDUCTOR INC5 citations73
US9601564B2Mar 21, 2017
Deep trench isolation
FREESCALE SEMICONDUCTOR INC4 citations73
US9343526B2May 17, 2016
Deep trench isolation
FREESCALE SEMICONDUCTOR INC3 citations73
US8896102B2Nov 25, 2014
Die edge sealing structures and related fabrication methods
FREESCALE SEMICONDUCTOR INC4 citations73
US7795702B2Sep 14, 2010
Microelectronic assemblies with improved isolation voltage performance
FREESCALE SEMICONDUCTOR INC6 citations73
US7553704B2Jun 30, 2009
Antifuse element and method of manufacture
FREESCALE SEMICONDUCTOR INC6 citations73
US7411270B2Aug 12, 2008
Composite capacitor and method for forming the same
FREESCALE SEMICONDUCTOR INC8 citations69
YANG HONGNING
14 patentsUS8541862B2Sep 24, 2013
Semiconductor device with self-biased isolation
YANG HONGNING23 citations93
US9306060B1Apr 5, 2016
Semiconductor devices and related fabrication methods
YANG HONGNING19 citations92
US9490322B2Nov 8, 2016
Semiconductor device with enhanced 3D resurf
YANG HONGNING5 citations84
US9231083B2Jan 5, 2016
High breakdown voltage LDMOS device
YANG HONGNING8 citations84
US9136323B2Sep 15, 2015
Drain-end drift diminution in semiconductor devices
YANG HONGNING6 citations84
US8853780B2Oct 7, 2014
Semiconductor device with drain-end drift diminution
YANG HONGNING7 citations84
US8772871B2Jul 8, 2014
Partially depleted dielectric resurf LDMOS
YANG HONGNING16 citations84
US8575692B2Nov 5, 2013
Near zero channel length field drift LDMOS
YANG HONGNING14 citations84
US8247869B2Aug 21, 2012
LDMOS transistors with a split gate
YANG HONGNING19 citations84
US9165918B1Oct 20, 2015
Composite semiconductor device with multiple threshold voltages
YANG HONGNING17 citations82
US9601595B2Mar 21, 2017
High breakdown voltage LDMOS device
YANG HONGNING3 citations73
US9543379B2Jan 10, 2017
Semiconductor device with peripheral breakdown protection
YANG HONGNING3 citations73
US8652930B2Feb 18, 2014
Semiconductor device with self-biased isolation
YANG HONGNING4 citations73
US9105657B2Aug 11, 2015
Methods for producing near zero channel length field drift LDMOS
YANG HONGNING3 citations63
NXP USA INC
5 patentsUS9905687B1Feb 27, 2018
Semiconductor device and method of making
NXP USA INC21 citations94
US9941350B1Apr 10, 2018
Semiconductor device isolation via depleted coupling layer
NXP USA INC13 citations84
US9831338B1Nov 28, 2017
Alternating source region arrangement
NXP USA INC8 citations84
US10297590B1May 21, 2019
Electro-static discharge protection device and method of making
NXP USA INC6 citations73
US10177252B2Jan 8, 2019
Semiconductor device isolation with RESURF layer arrangement
NXP USA INC2 citations73
LIN XIN
3 patentsMIN WON GI
2 patentsZHANG ZHIHONG
1 patentCHENG XU
1 patentShowing the top 50 of 103 patents by PatentIndex Score.