Inventor · disambiguated record
Sead Zildzic
Also filed as: ZILDZIC JR SEAD · ZILDZIC SEAD
17 granted patents·13 pending applications·10 citations·filing 2018–2025
88Inventor score
Files withMICRON TECHNOLOGY INC30
Top patents by PatentIndex Score
30 records- 0188US12272408B2Partial block read level voltage compensation to decrease read trigger ratesMICRON TECHNOLOGY INC·Filed 2023·Granted Apr 8, 2025·2 cites·18 claims
- 0288US12224017B2Read level compensation for partially programmed blocks of memory devicesMICRON TECHNOLOGY INC·Filed 2022·Granted Feb 11, 2025·2 cites·20 claims
- 0386US12254926B2Memory device with fast write mode to mitigate power lossMICRON TECHNOLOGY INC·Filed 2022·Granted Mar 18, 2025·1 cites·25 claims
- 0486US12217799B2Parallelized defect detection across multiple sub-blocks in a memory deviceMICRON TECHNOLOGY INC·Filed 2023·Granted Feb 4, 2025·1 cites·20 claims
- 0579US11475969B2Scan optimization using data selection across wordline of a memory arrayMICRON TECHNOLOGY INC·Filed 2020·Granted Oct 18, 2022·1 cites·18 claims
- 0678US10936392B2Read window sizeMICRON TECHNOLOGY INC·Filed 2018·Granted Mar 2, 2021·3 cites·20 claims
- 0775US12217794B2Managing the programming of an open translation unitMICRON TECHNOLOGY INC·Filed 2024·Granted Feb 4, 2025·0 cites·20 claims
- 0873US2025266103A1Boost voltage modulated corrective readMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 0973US2025118364A1Managing the programming of an open translation unitMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1071US2025078932A1Concurrent programming of retired wordline cells with dummy dataMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1171US2025182827A1Memory device with fast write mode to mitigate power lossMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 1271US2024402922A1Two-tier defect scan managementMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1371US2025004645A1Copyback clear command for performing a scan and read in a memory deviceMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1470US12242722B2Underfill detection for memory systemsMICRON TECHNOLOGY INC·Filed 2023·Granted Mar 4, 2025·0 cites·20 claims
- 1570US12170113B2Concurrent programming of retired wordline cells with dummy dataMICRON TECHNOLOGY INC·Filed 2022·Granted Dec 17, 2024·0 cites·20 claims
- 1668US2025201317A1Partial block read level voltage compensation to decrease read trigger ratesMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 1768US2025124987A1Read level compensation for partially programmed blocks of memory devicesMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1867US12105967B2Two-tier defect scan managementMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 1, 2024·0 cites·20 claims
- 1967US11923001B2Managing the programming of an open translation unitMICRON TECHNOLOGY INC·Filed 2022·Granted Mar 5, 2024·0 cites·20 claims
- 2066US2025140317A1Parallelized defect detection across multiple sub-blocks in a memory deviceMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 2166US2025156071A1Underfill detection for memory systemsMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 2265US12475946B2Memory devices with a lower effective program verify levelMICRON TECHNOLOGY INC·Filed 2023·Granted Nov 18, 2025·0 cites·20 claims
- 2364US12105961B2Copyback clear command for performing a scan and read in a memory deviceMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 1, 2024·0 cites·20 claims
- 2463US12315575B2Boost voltage modulated corrective readMICRON TECHNOLOGY INC·Filed 2023·Granted May 27, 2025·0 cites·20 claims
- 2562US11715547B2Scan optimization using data selection across wordline of a memory arrayMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 1, 2023·0 cites·20 claims
- 2662US11231982B2Read window sizeMICRON TECHNOLOGY INC·Filed 2021·Granted Jan 25, 2022·0 cites·20 claims
- 2762US2025364065A1Transient threshold voltage scanMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 2858US12505883B2Pre-read operation for multi-pass programming of memory devicesMICRON TECHNOLOGY INC·Filed 2023·Granted Dec 23, 2025·0 cites·20 claims
- 2956US2025181240A1Block-efficient write policies for memory devicesMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 3044US2023206992A1Concurrent scan operation on multiple blocks in a memory deviceMICRON TECHNOLOGY INC·Filed 2022·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →