Inventor
XU CHENG-BAI
US69 patents
⚠️ This page may combine multiple inventors who share the name “XU CHENG-BAI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ROHM & HAAS ELECT MAT
33 patentsUS9209035B2Dec 8, 2015
Photoresist pattern trimming methods
ROHM & HAAS ELECT MAT7 citations84
US9046767B2Jun 2, 2015
Photoacid generator, photoresist, coated substrate, and method of forming an electronic device
ROHM & HAAS ELECT MAT7 citations84
US9029065B2May 12, 2015
Photoacid generating compound and photoresist composition comprising same, coated article comprising the photoresist and method of making an article
ROHM & HAAS ELECT MAT7 citations84
US8900794B2Dec 2, 2014
Photoacid generator and photoresist comprising same
ROHM & HAAS ELECT MAT7 citations83
US10466588B2Nov 5, 2019
Sulfonyl photoacid generators and photoresists comprising same
ROHM & HAAS ELECT MAT2 citations73
US10221131B2Mar 5, 2019
Acid generator compounds and photoresists comprising same
ROHM & HAAS ELECT MAT4 citations73
US9583344B2Feb 28, 2017
Photoresist pattern trimming methods
ROHM & HAAS ELECT MAT2 citations73
US9508549B2Nov 29, 2016
Methods of forming electronic devices including filling porous features with a polymer
ROHM & HAAS ELECT MAT3 citations73
US9209067B2Dec 8, 2015
Gap-fill methods
ROHM & HAAS ELECT MAT5 citations73
US10539870B2Jan 21, 2020
Photoresists comprising carbamate component
ROHM & HAAS ELECT MAT2 citations72
US10162266B2Dec 25, 2018
Photoresist pattern trimming methods
ROHM & HAAS ELECT MAT2 citations72
US9869933B2Jan 16, 2018
Pattern trimming methods
ROHM & HAAS ELECT MAT3 citations72
US9541834B2Jan 10, 2017
Ionic thermal acid generators for low temperature applications
ROHM & HAAS ELECT MAT3 citations72
US9209028B2Dec 8, 2015
Ion implantation methods
ROHM & HAAS ELECT MAT4 citations71
US9753370B2Sep 5, 2017
Multiple-pattern forming methods
ROHM & HAAS ELECT MAT2 citations70
US9324604B2Apr 26, 2016
Gap-fill methods
ROHM & HAAS ELECT MAT3 citations68
US9067909B2Jun 30, 2015
Photoacid generator, photoresist, coated substrate, and method of forming an electronic device
ROHM & HAAS ELECT MAT3 citations63
US9110369B2Aug 18, 2015
Photoacid generator, photoresist, coated substrate, and method of forming an electronic device
ROHM & HAAS ELECT MAT2 citations62
US8956799B2Feb 17, 2015
Photoacid generator and photoresist comprising same
ROHM & HAAS ELECT MAT2 citations62
US11506981B2Nov 22, 2022
Photoresist pattern trimming compositions and pattern formation methods
ROHM & HAAS ELECT MAT1 citations61
US10578969B2Mar 3, 2020
Photoresist topcoat compositions and methods of processing photoresist compositions
ROHM & HAAS ELECT MAT1 citations61
US11754927B2Sep 12, 2023
Photoresist pattern trimming compositions and pattern formation methods
ROHM & HAAS ELECT MAT0 citations58
US10719014B2Jul 21, 2020
Photoresists comprising amide component
ROHM & HAAS ELECT MAT0 citations52
US10558122B2Feb 11, 2020
Compositions comprising sulfonamide material and processes for photolithography
ROHM & HAAS ELECT MAT0 citations52
US10527934B2Jan 7, 2020
Photoresists comprising ionic compound
ROHM & HAAS ELECT MAT0 citations52
US10222699B2Mar 5, 2019
Compositions and processes for immersion lithography
ROHM & HAAS ELECT MAT0 citations52
US9475763B2Oct 25, 2016
Photoresist comprising nitrogen-containing compound
ROHM & HAAS ELECT MAT0 citations52
US9256125B2Feb 9, 2016
Acid generators and photoresists comprising same
ROHM & HAAS ELECT MAT1 citations52
US8790861B2Jul 29, 2014
Cycloaliphatic monomer, polymer comprising the same, and photoresist composition comprising the polymer
ROHM & HAAS ELECT MAT0 citations52
US8012670B2Sep 6, 2011
Photoresist systems
ROHM & HAAS ELECT MAT0 citations52
US10809616B2Oct 20, 2020
Cholate photoacid generators and photoresists comprising same
ROHM & HAAS ELECT MAT0 citations51
US10684549B2Jun 16, 2020
Pattern-formation methods
ROHM & HAAS ELECT MAT0 citations51
US10197918B2Feb 5, 2019
Photoresist topcoat compositions and methods of processing photoresist compositions
ROHM & HAAS ELECT MAT0 citations51
WANG DEYAN
8 patentsUS8871428B2Oct 28, 2014
Compositions and processes for immersion lithography
WANG DEYAN4 citations84
US8257902B2Sep 4, 2012
Compositons and processes for immersion lithography
WANG DEYAN10 citations84
US8722825B2May 13, 2014
Surface active additive and photoresist composition comprising same
WANG DEYAN4 citations73
US11106137B2Aug 31, 2021
Compositions comprising base-reactive component and processes for photolithography
WANG DEYAN0 citations61
US10359698B2Jul 23, 2019
Compositions comprising hetero-substituted carbocyclic aryl component and processes for photolithography
WANG DEYAN0 citations52
US9005880B2Apr 14, 2015
Compositions comprising sulfonamide material and processes for photolithography
WANG DEYAN1 citations52
US8975006B2Mar 10, 2015
Compositions comprising carboxy component and processes for photolithography
WANG DEYAN1 citations52
US8158325B2Apr 17, 2012
Compositions and processes for photolithography
WANG DEYAN1 citations52
AQAD EMAD
3 patentsUS9156785B2Oct 13, 2015
Base reactive photoacid generators and photoresists comprising same
AQAD EMAD9 citations83
US9348220B2May 24, 2016
Photoacid generators and photoresists comprising same
AQAD EMAD5 citations72
US9671689B2Jun 6, 2017
Cholate photoacid generators and photoresists comprising same
AQAD EMAD3 citations71
LI MINGQI
2 patentsLIU CONG
1 patentROHM AND HAAS ELECTRIC MATERIA
1 patentRohm and Hass Electronic Materials LLC
1 patentPROKOPOWICZ GREGORY P
1 patentShowing the top 50 of 69 patents by PatentIndex Score.