P

Inventor

EIMORI TAKAHISA

JP37 patents
⚠️ This page may combine multiple inventors who share the name “EIMORI TAKAHISA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITSUBISHI ELECTRIC CORP

33 patents
US5834817ANov 10, 1998

Field effect transistor with a shaped gate electrode

MITSUBISHI ELECTRIC CORP42 citations96
US5272100ADec 21, 1993

Field effect transistor with T-shaped gate electrode and manufacturing method therefor

MITSUBISHI ELECTRIC CORP61 citations96
US5245208ASep 14, 1993

Semiconductor device and manufacturing method thereof

MITSUBISHI ELECTRIC CORP66 citations96
US5051948ASep 24, 1991

Content addressable memory device

MITSUBISHI ELECTRIC CORP81 citations96
US4994893AFeb 19, 1991

Field effect transistor substantially coplanar surface structure

MITSUBISHI ELECTRIC CORP62 citations96
US5654573AAug 5, 1997

Semiconductor device having SOI structure and manufacturing method therefor

MITSUBISHI ELECTRIC CORP53 citations95
US6740584B2May 25, 2004

Semiconductor device and method of fabricating the same

MITSUBISHI ELECTRIC CORP21 citations92
US5930614AJul 27, 1999

Method for forming MOS device having field shield isolation

MITSUBISHI ELECTRIC CORP22 citations92
US5850090ADec 15, 1998

Dynamic semiconductor memory device on SOI substrate

MITSUBISHI ELECTRIC CORP26 citations92
US5691551ANov 25, 1997

Semiconductor memory device

MITSUBISHI ELECTRIC CORP28 citations92
US5650342AJul 22, 1997

Method of making a field effect transistor with a T shaped polysilicon gate electrode

MITSUBISHI ELECTRIC CORP18 citations92
US5637899AJun 10, 1997

Semiconductor device

MITSUBISHI ELECTRIC CORP49 citations92
US5521419AMay 28, 1996

Semiconductor device having field shield element isolating structure and method of manufacturing the same

MITSUBISHI ELECTRIC CORP36 citations92
US5442212AAug 15, 1995

Semiconductor memory device

MITSUBISHI ELECTRIC CORP34 citations92
US5225704AJul 6, 1993

Field shield isolation structure for semiconductor memory device and method for manufacturing the same

MITSUBISHI ELECTRIC CORP37 citations92
US5177571AJan 5, 1993

Ldd mosfet with particularly shaped gate electrode immune to hot electron effect

MITSUBISHI ELECTRIC CORP37 citations92
US5164803ANov 17, 1992

Cmos semiconductor device with an element isolating field shield

MITSUBISHI ELECTRIC CORP36 citations92
US5089863AFeb 18, 1992

Field effect transistor with T-shaped gate electrode

MITSUBISHI ELECTRIC CORP33 citations92
US5471080ANov 28, 1995

Field effect transistor with a shaped gate electrode

MITSUBISHI ELECTRIC CORP19 citations82
US5094965AMar 10, 1992

Field effect transistor having substantially coplanar surface structure and a manufacturing method therefor

MITSUBISHI ELECTRIC CORP21 citations82
US5067000ANov 19, 1991

Semiconductor device having field shield isolation

MITSUBISHI ELECTRIC CORP17 citations82
US6268278B1Jul 31, 2001

Semiconductor device and manufacturing process thereof

MITSUBISHI ELECTRIC CORP7 citations74
US6087710AJul 11, 2000

Semiconductor device having self-aligned contacts

MITSUBISHI ELECTRIC CORP5 citations74
US5610418AMar 11, 1997

Semiconductor memory device

MITSUBISHI ELECTRIC CORP16 citations74
US5543646AAug 6, 1996

Field effect transistor with a shaped gate electrode

MITSUBISHI ELECTRIC CORP11 citations74
US5459344AOct 17, 1995

Stacked capacitor type semiconductor memory device and manufacturing method thereof

MITSUBISHI ELECTRIC CORP12 citations74
US5278437AJan 11, 1994

Stacked capacitor type semiconductor memory device and manufacturing method thereof

MITSUBISHI ELECTRIC CORP7 citations74
US5181094AJan 19, 1993

Complementary semiconductor device having improved device isolating region

MITSUBISHI ELECTRIC CORP9 citations74
US5180683AJan 19, 1993

Method of manufacturing stacked capacitor type semiconductor memory device

MITSUBISHI ELECTRIC CORP9 citations74
US5097310AMar 17, 1992

Complementary semiconductor device having improved device isolating region

MITSUBISHI ELECTRIC CORP10 citations74
US5721444AFeb 24, 1998

Thin-film transistor having a buried impurity region and method of fabricating the same

MITSUBISHI ELECTRIC CORP10 citations73
US6495928B1Dec 17, 2002

Transfer mark structure for multi-layer interconnecting and method for the manufacture thereof

MITSUBISHI ELECTRIC CORP6 citations62
US6573171B2Jun 3, 2003

Semiconductor device and manufacturing process thereof

MITSUBISHI ELECTRIC CORP0 citations52

MITSUBISHI DENKI KABUSHIKI KAS

1 patent

MISE NOBUYUKI

1 patent

RENESAS TECH CORP

1 patent

EIMORI TAKAHISA

1 patent