Inventor

FANG WEI

US154 patents

⚠️ This page may combine multiple inventors who share the name “FANG WEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FANG WEI

ASML NETHERLANDS BV

Systems and methods of optimal metrology guidance

Local alignment point calibration method in die inspection

In-die metrology methods and systems for process control

Low dose charged particle metrology system

Pattern grouping method based on machine learning

Method for determining corrections to features of a mask

Defect pattern grouping method and system

HERMES MICROVISION INC

Inspection method and system

Method and system for fast inspecting defects

Method and system for measuring critical dimension and monitoring fabrication uniformity

Method and system for fast inspecting defects

Local alignment point calibration method in die inspection

Hot spot identification, inspection, and review

BEIJING XIAOMI MOBILE SOFTWARE CO LTD

Mobile phone

Mobile phone

Mobile phone

Mobile phone

Mobile phone

FANG WEI

Sex toy

Artificial lighting apparatus for young plants using light emitting diodes as light source

Artificial lighting apparatus for young plants using light emitting diodes as light source

Charged particle beam imaging assembly and imaging method thereof

Method for inspecting localized image and system thereof

INTEL CORP

Method and apparatus for adjusting demarcation voltages based on cycle count metrics

Memory preset adjustment based on adaptive calibration

Method and apparatus for reducing silent data errors in non-volatile memory systems

Managing redundancy information in a non-volatile memory

HUAWEI TECH CO LTD

Circuit board assembly and electronic device

Method, apparatus and system for measuring network packet loss

Circuit board assembly and electronic device

EBAY INC

Processing high volume network data

Processing high volume network data

ZHEJIANG DAHUA TECHNOLOGY CO

Methods and systems for filling light for video images

Methods and systems for image processing

Zhang zhao-li

Method and system for determining a defect during charged particle beam inspection of a sample

HERMES MICROVISION INC TAIWAN

System and method to determine focus parameters during an electron beam inspection

AMBARELLA INC

Fast and energy-efficient region of interest pooling for object detection with convolutional neural network

MICROSOFT TECHNOLOGY LICENSING LLC

Answering relational database queries using graph exploration

XIAO HONG

Method and apparatus for identifying plug-to-plug short from a charged particle microscopic image

LIAO CHAD

Method and system for filtering noises in an image scanned by charged particles

JAU JACK

E-beam defect review system

CHEN SHIH-TSUNG

Methods for promoting semiconductor manufacturing yield and classifying defects during fabricating a semiconductor device, and computer readable mediums encoded with a computer program implementing the same

MUNTERS CORP

Active/passive cooling system

UBTECH ROBOTICS CORP LTD

Pose determining method for mobile robot and apparatus and mobile robot thereof

VMWARE INC

Distributed storage system and method of reusing symmetric keys for encrypted message transmissions

HANGZHOU JIAWEI E COMMERCE CO LTD

Protective case for electronic tracking device

UNIV JIANGNAN

Text classification backdoor attack prediction method, system, and device

AMBARELLA INT LP

Hardware efficient RoI align

ZHONGSHAN GUANGHE MEDICAL TECH CO LTD

Preparation method, product and application of non-free radical photo-crosslinked hydrogel material

SEMICONDUCTOR MFG INT SHANGHAI CORP

Electronic circuit, electronic apparatus, and method for eliminating metastability