Inventor

Zhang zhao-li

US12 patents

⚠️ This page may combine multiple inventors who share the name “Zhang zhao-li”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ASML NETHERLANDS BV

3 patents

US11880971B2Jan 23, 2024

HERMES MICROVISION INC

2 patents

US10102619B1Oct 16, 2018

Inspection method and system

HERMES MICROVISION INC4 citations84

US9965844B1May 8, 2018

Inspection method and system

HERMES MICROVISION INC1 citations62

FANG WEI

2 patents

US8606017B1Dec 10, 2013

Method for inspecting localized image and system thereof

FANG WEI7 citations83

US8805054B2Aug 12, 2014

Method and system of classifying defects on a wafer

FANG WEI0 citations51

HONGFUJIN PREC IND WUHAN

2 patents

US12150265B2Nov 19, 2024

SSD card adapter bracket and circuit board assembly

HONGFUJIN PREC IND WUHAN0 citations51

US12026023B2Jul 2, 2024

Support assembly and chassis structure having the same

HONGFUJIN PREC IND WUHAN0 citations51

Zhang zhao-li

1 patent

US8068662B2Nov 29, 2011

Method and system for determining a defect during charged particle beam inspection of a sample

Zhang zhao-li46 citations91

LIAO CHAD

1 patent

US8712184B1Apr 29, 2014

Method and system for filtering noises in an image scanned by charged particles

LIAO CHAD20 citations84

CHEN SHIH-TSUNG

1 patent

US9251581B1Feb 2, 2016

Methods for promoting semiconductor manufacturing yield and classifying defects during fabricating a semiconductor device, and computer readable mediums encoded with a computer program implementing the same

CHEN SHIH-TSUNG14 citations77