Inventor
NAKANO RIKIZO
JP10 patents
⚠️ This page may combine multiple inventors who share the name “NAKANO RIKIZO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FUJITSU LTD
4 patentsUS8972822B2Mar 3, 2015
Memory module and semiconductor storage device
FUJITSU LTD16 citations83
US5481551AJan 2, 1996
IC element testing device
FUJITSU LTD17 citations72
US5396466AMar 7, 1995
Method of testing bit lines of a memory unit
FUJITSU LTD4 citations61
US7990172B2Aug 2, 2011
Method and apparatus for testing electronic device
FUJITSU LTD2 citations60
NAKANO RIKIZO
3 patentsUS8738976B2May 27, 2014
Memory error detecting apparatus and method
NAKANO RIKIZO9 citations81
US8423842B2Apr 16, 2013
Test apparatus and test method for testing a memory device
NAKANO RIKIZO8 citations81
US8868990B2Oct 21, 2014
Semiconductor memory device and information processing apparatus including the same
NAKANO RIKIZO0 citations49