Inventor
JEONG HA NEUL
KR4 patents
⚠️ This page may combine multiple inventors who share the name “JEONG HA NEUL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
3 patentsUS9026854B2May 5, 2015
Method of testing universal flash storage (UFS) interface and memory device implementing method of testing UFS interface
SAMSUNG ELECTRONICS CO LTD13 citations79
US9542264B2Jan 10, 2017
Memory system monitoring data integrity and related method of operation
SAMSUNG ELECTRONICS CO LTD4 citations68
US12229436B2Feb 18, 2025
Memory controller comprising multiple buffer memories, and handling of read after write hazards
SAMSUNG ELECTRONICS CO LTD0 citations47