Inventor
NARESH NIKITA
IN11 patents
Patents
11 patentsUS10866280B2Dec 15, 2020
Scan chain self-testing of lockstep cores on reset
TEXAS INSTRUMENTS INC5 citations82
US11555853B2Jan 17, 2023
Scan chain self-testing of lockstep cores on reset
TEXAS INSTRUMENTS INC1 citations71
US11680984B1Jun 20, 2023
Control data registers for scan testing
TEXAS INSTRUMENTS INC2 citations70
US11852683B2Dec 26, 2023
Scan chain self-testing of lockstep cores on reset
TEXAS INSTRUMENTS INC0 citations61
US11521698B2Dec 6, 2022
Testing read-only memory using memory built-in self-test controller
TEXAS INSTRUMENTS INC0 citations58
US10818374B2Oct 27, 2020
Testing read-only memory using memory built-in self-test controller
TEXAS INSTRUMENTS INC1 citations58
US10460821B2Oct 29, 2019
Area efficient parallel test data path for embedded memories
TEXAS INSTRUMENTS INC1 citations58
US12142337B2Nov 12, 2024
System and method for parallel memory test
TEXAS INSTRUMENTS INC0 citations57
US11776656B2Oct 3, 2023
System and method for parallel memory test
TEXAS INSTRUMENTS INC0 citations57
US9899103B2Feb 20, 2018
Area efficient parallel test data path for embedded memories
TEXAS INSTRUMENTS INC0 citations48
US11715544B2Aug 1, 2023
System and method for low power memory test
TEXAS INSTRUMENTS INC0 citations47