P

Inventor

HU XIANG

US62 patents
⚠️ This page may combine multiple inventors who share the name “HU XIANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

GLOBALFOUNDRIES INC

25 patents
US9735154B2Aug 15, 2017

Semiconductor structure having gap fill dielectric layer disposed between fins

GLOBALFOUNDRIES INC9 citations83
US9105478B2Aug 11, 2015

Devices and methods of forming fins at tight fin pitches

GLOBALFOUNDRIES INC9 citations83
US9121890B2Sep 1, 2015

Planar metrology pad adjacent a set of fins of a fin field effect transistor device

GLOBALFOUNDRIES INC5 citations82
US9490129B2Nov 8, 2016

Integrated circuits having improved gate structures and methods for fabricating same

GLOBALFOUNDRIES INC5 citations73
US9305785B2Apr 5, 2016

Semiconductor contacts and methods of fabrication

GLOBALFOUNDRIES INC4 citations73
US9666476B2May 30, 2017

Dimension-controlled via formation processing

GLOBALFOUNDRIES INC2 citations72
US8907496B1Dec 9, 2014

Circuit structures and methods of fabrication with enhanced contact via electrical connection

GLOBALFOUNDRIES INC4 citations72
US9224842B2Dec 29, 2015

Patterning multiple, dense features in a semiconductor device using a memorization layer

GLOBALFOUNDRIES INC5 citations71
US9040380B2May 26, 2015

Integrated circuits having laterally confined epitaxial material overlying fin structures and methods for fabricating same

GLOBALFOUNDRIES INC6 citations70
US10181420B2Jan 15, 2019

Devices with chamfer-less vias multi-patterning and methods for forming chamfer-less vias

GLOBALFOUNDRIES INC2 citations68
US9817927B2Nov 14, 2017

Hard mask etch and dielectric etch aware overlap for via and metal layers

GLOBALFOUNDRIES INC2 citations68
US8877642B2Nov 4, 2014

Double-pattern gate formation processing with critical dimension control

GLOBALFOUNDRIES INC2 citations63
US9305832B2Apr 5, 2016

Dimension-controlled via formation processing

GLOBALFOUNDRIES INC2 citations62
US8940641B1Jan 27, 2015

Methods for fabricating integrated circuits with improved patterning schemes

GLOBALFOUNDRIES INC2 citations62
US9196499B2Nov 24, 2015

Method of forming semiconductor fins

GLOBALFOUNDRIES INC3 citations61
US9129905B2Sep 8, 2015

Planar metrology pad adjacent a set of fins of a fin field effect transistor device

GLOBALFOUNDRIES INC3 citations61
US9520395B2Dec 13, 2016

FinFET devices comprising a dielectric layer/CMP stop layer/hardmask/etch stop layer/gap-fill material stack

GLOBALFOUNDRIES INC2 citations60
US9793358B2Oct 17, 2017

Non-planar semiconductor device with multiple-head epitaxial structure on fin

GLOBALFOUNDRIES INC0 citations52
US9508794B2Nov 29, 2016

Mixed N/P-type fin semiconductor structure with epitaxial materials having increased surface area through multiple epitaxial heads

GLOBALFOUNDRIES INC1 citations52
US9431528B2Aug 30, 2016

Lithographic stack excluding SiARC and method of using same

GLOBALFOUNDRIES INC0 citations52
US9275906B2Mar 1, 2016

Method for increasing a surface area of epitaxial structures in a mixed N/P type fin semiconductor structure by forming multiple epitaxial heads

GLOBALFOUNDRIES INC1 citations52
US10121711B2Nov 6, 2018

Planar metrology pad adjacent a set of fins of a fin field effect transistor device

GLOBALFOUNDRIES INC0 citations51
US9460963B2Oct 4, 2016

Self-aligned contacts and methods of fabrication

GLOBALFOUNDRIES INC1 citations51
US9236301B2Jan 12, 2016

Customized alleviation of stresses generated by through-substrate via(S)

GLOBALFOUNDRIES INC1 citations51
US9034767B1May 19, 2015

Facilitating mask pattern formation

GLOBALFOUNDRIES INC0 citations51

HUAWEI TECH CO LTD

10 patents

ALIBABA GROUP HOLDING LTD

3 patents

SEMICONDUCTOR MFG INT SHANGHAI CORP

3 patents

HU XIANG

3 patents

CHARTERED SEMICONDUCTOR MFG

1 patent

QUALCOMM INC

1 patent

IBM

1 patent

GLOBALFOUNDRIES SG PTE LTD

1 patent

SEMICONDUCTOR MFG INT BEIJING CORP

1 patent

VMWARE INC

1 patent

Showing the top 50 of 62 patents by PatentIndex Score.