Inventor
LANGER ECKHARD
DE10 patents
⚠️ This page may combine multiple inventors who share the name “LANGER ECKHARD”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANCED MICRO DEVICES INC
5 patentsUS7611991B2Nov 3, 2009
Technique for increasing adhesion of metallization layers by providing dummy vias
ADVANCED MICRO DEVICES INC8 citations79
US7335880B2Feb 26, 2008
Technique for CD measurement on the basis of area fraction determination
ADVANCED MICRO DEVICES INC8 citations71
US6953755B2Oct 11, 2005
Technique for monitoring the state of metal lines in microstructures
ADVANCED MICRO DEVICES INC6 citations71
US7311008B2Dec 25, 2007
Semiconductor structure comprising a stress sensitive element and method of measuring a stress in a semiconductor structure
ADVANCED MICRO DEVICES INC3 citations61
US6716650B2Apr 6, 2004
Interface void monitoring in a damascene process
ADVANCED MICRO DEVICES INC1 citations51
MEYER MORITZ ANDREAS
3 patentsUS8575029B2Nov 5, 2013
Technique for forming metal lines in a semiconductor by adapting the temperature dependence of the line resistance
MEYER MORITZ ANDREAS0 citations48
US8058731B2Nov 15, 2011
Technique for forming metal lines in a semiconductor by adapting the temperature dependence of the line resistance
MEYER MORITZ ANDREAS0 citations48
US8058081B2Nov 15, 2011
Method of testing an integrity of a material layer in a semiconductor structure
MEYER MORITZ ANDREAS0 citations47