Inventor
ZIENERT INKA
DE2 patents
Patents
2 patentsUS7421060B2Sep 2, 2008
Method of determining an orientation of a crystal lattice of a first substrate relative to a crystal lattice of a second substrate
ADVANCED MICRO DEVICES INC16 citations78
US7718447B2May 18, 2010
System and method for estimating the crystallinity of stacked metal lines in microstructures
ADVANCED MICRO DEVICES INC3 citations53