Inventor
MEYER MORITZ-ANDREAS
DE10 patents
⚠️ This page may combine multiple inventors who share the name “MEYER MORITZ-ANDREAS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
GLOBALFOUNDRIES INC
3 patentsUS9281252B1Mar 8, 2016
Method comprising applying an external mechanical stress to a semiconductor structure and semiconductor processing tool
GLOBALFOUNDRIES INC17 citations76
US8039395B2Oct 18, 2011
Technique for forming embedded metal lines having increased resistance against stress-induced material transport
GLOBALFOUNDRIES INC5 citations60
US9898572B2Feb 20, 2018
Metal line layout based on line shifting
GLOBALFOUNDRIES INC0 citations42
ADVANCED MICRO DEVICES INC
3 patentsUS7335880B2Feb 26, 2008
Technique for CD measurement on the basis of area fraction determination
ADVANCED MICRO DEVICES INC8 citations71
US6953755B2Oct 11, 2005
Technique for monitoring the state of metal lines in microstructures
ADVANCED MICRO DEVICES INC6 citations71
US7718447B2May 18, 2010
System and method for estimating the crystallinity of stacked metal lines in microstructures
ADVANCED MICRO DEVICES INC3 citations53
MEYER MORITZ ANDREAS
3 patentsUS8575029B2Nov 5, 2013
Technique for forming metal lines in a semiconductor by adapting the temperature dependence of the line resistance
MEYER MORITZ ANDREAS0 citations48
US8058731B2Nov 15, 2011
Technique for forming metal lines in a semiconductor by adapting the temperature dependence of the line resistance
MEYER MORITZ ANDREAS0 citations48
US8058081B2Nov 15, 2011
Method of testing an integrity of a material layer in a semiconductor structure
MEYER MORITZ ANDREAS0 citations47