Inventor
STEPS STEVEN C
US25 patents
⚠️ This page may combine multiple inventors who share the name “STEPS STEVEN C”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
AEHR TEST SYSTEMS
20 patentsUS7667475B2Feb 23, 2010
Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion
AEHR TEST SYSTEMS16 citations92
US12292484B2May 6, 2025
Method and system for thermal control of devices in an electronics tester
AEHR TEST SYSTEMS1 citations75
US12007451B2Jun 11, 2024
Method and system for thermal control of devices in an electronics tester
AEHR TEST SYSTEMS2 citations73
US10649022B2May 12, 2020
Electronics tester
AEHR TEST SYSTEMS1 citations73
US10466292B2Nov 5, 2019
Method and system for thermal control of devices in an electronics tester
AEHR TEST SYSTEMS1 citations73
USD850309SJun 4, 2019
Layout of contacts
AEHR TEST SYSTEMS4 citations73
US12265136B2Apr 1, 2025
Method and system for thermal control of devices in electronics tester
AEHR TEST SYSTEMS0 citations62
US12169217B2Dec 17, 2024
Electronics tester
AEHR TEST SYSTEMS0 citations62
US11821940B2Nov 21, 2023
Electronics tester
AEHR TEST SYSTEMS0 citations62
US11635459B2Apr 25, 2023
Electronics tester
AEHR TEST SYSTEMS0 citations62
US11209497B2Dec 28, 2021
Method and system for thermal control of devices in an electronics tester
AEHR TEST SYSTEMS0 citations62
US11199572B2Dec 14, 2021
Electronics tester
AEHR TEST SYSTEMS0 citations62
US10976362B2Apr 13, 2021
Electronics tester with power saving state
AEHR TEST SYSTEMS0 citations62
US9291668B2Mar 22, 2016
Electronics tester with a valve integrally formed in a component of a portable pack
AEHR TEST SYSTEMS1 citations59
USD875579SFeb 18, 2020
Layout of contacts
AEHR TEST SYSTEMS0 citations52
US10718808B2Jul 21, 2020
Electronics tester with current amplification
AEHR TEST SYSTEMS0 citations51
US10151793B2Dec 11, 2018
Electronics tester with double-spiral thermal control passage in a thermal chuck
AEHR TEST SYSTEMS0 citations51
US9857418B2Jan 2, 2018
Electronics tester with group and individual current configurations
AEHR TEST SYSTEMS0 citations51
US9500702B2Nov 22, 2016
Electronics tester with hot fluid thermal control
AEHR TEST SYSTEMS0 citations51
US7902846B2Mar 8, 2011
Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion
AEHR TEST SYSTEMS0 citations51
HEWLETT PACKARD CO
3 patentsUS4858111AAug 15, 1989
Write-back cache system using concurrent address transfers to setup requested address in main memory before dirty miss signal from cache
HEWLETT PACKARD CO49 citations92
US4724518AFeb 9, 1988
Odd/even storage in cache memory
HEWLETT PACKARD CO50 citations92
US4654787AMar 31, 1987
Apparatus for locating memory modules having different sizes within a memory space
HEWLETT PACKARD CO45 citations91