Inventor

LEE SANG-KIL

KR65 patents

⚠️ This page may combine multiple inventors who share the name “LEE SANG-KIL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LEE SANG-KIL

SAMSUNG ELECTRONICS CO LTD

Method and circuit for testing memory cells in semiconductor memory device

Semiconductor memory device having single-level cells and multi-level cells and method of driving the semiconductor memory device

Apparatus and method for measuring each thickness of a multilayer stacked on a substrate

Programmable refresh circuits and methods for integrated circuit memory devices

Image creating method and imaging system for performing the same

Scanning electron microscope system capable of measuring in-cell overlay offset using high-energy electron beam and method thereof

Broadband light source and optical inspector having the same

Spectral ellipsometry measurement and data analysis device and related systems and methods

Method of inspecting wafer

Methods and systems for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles

Methods of manufacturing and testing integrated circuit field effect transistors using scanning electron microscope to detect undesired conductive material

Broadband light illuminators

In-line test of contact opening of semiconductor device

Surface inspecting method

Fuse signature circuits for microelectronic devices

Portable storage apparatus and method for freely changing data bus width

Portable storage apparatus and method for freely changing data bus width

Method of inspecting wafer using electron beam

Semiconductor device

Methods of fabricating microelectronic substrate inspection equipment

Method and apparatus for classifying defects of an object

Computer program products for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles

Using a submicron level dimension reference

Conductive atomic force microscope and method of operating the same

Oxide film thickness standards

Image sensor and image sensing device

Semiconductor device

Image sensor

Memory device including arithmetic circuit and neural network system including the same

Method and apparatus to measure step height of device using scanning electron microscope

Methods, systems and computer program products for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles

Auto focusing apparatus and method

Method and apparatus for numerically analyzing grain growth on semiconductor wafer using SEM image

KOREA RES INST STANDARDS & SCI

Squid sensor module and magnetoencephalography measuring apparatus

Apparatus and method for indirectly cooling superconducting quantum interference device

Magnetoencephalography measuring apparatus

Multimodal position transformation dual-helmet MEG apparatus

Magnetocardiography measuring apparatus

KOLON INC

Side curtain airbag and airbag system comprising the same

LEE SANG KIL

Block studying tool for infant

DREAMBIOGEN CO LTD

Method for cell-free protein complete post-translational modification

CORENTEC CO LTD

Sterilization box for medical devices

THE KOREA RES INSTITUTE OF STANDARDS AND SCIENCE “KRISS”

Multi-sensor magneto-monitoring-imaging system

KIM SUN HEE

Stable liquid formulation of human growth hormone

YUN SEONG-JIN

Overlay measuring method and system, and method of manufacturing semiconductor device using the same

SOHN YOUNG-HOON

Methods of generating three-dimensional process window qualification

KIM MIN-KOOK

Microelectronic substrate inspection equipment using helium ion microscopy

HONG KI-HYUN

Light source unit, manufacturing method thereof, and display device having the same

SEEGENE INC

TD probe and its uses

KIM JAE-HYUNG

Polyester fabrics for airbag and preparation method thereof