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Inventor
WAGATA HIROTAKA
JP
5 patents
⚠️ This page may combine multiple inventors who share the name “WAGATA HIROTAKA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UESAKA RYO
2 patents
US9583854B2
Feb 28, 2017
Connector and semiconductor testing device having the same
UESAKA RYO
6 citations
71
US8558568B2
Oct 15, 2013
Connector and semiconductor testing device using the same
UESAKA RYO
4 citations
61
ADVANTEST CORP
1 patent
US6421624B1
Jul 16, 2002
Multi-port device analysis apparatus and method and calibration method thereof
ADVANTEST CORP
57 citations
94
ADVANTEST
1 patent
US7359814B1
Apr 15, 2008
Multi-port analysis apparatus and method and calibration method thereof
ADVANTEST
21 citations
87
WAGATA HIROTAKA
1 patent
US8657625B2
Feb 25, 2014
Connector and semiconductor test device
WAGATA HIROTAKA
3 citations
56