Inventor
TIWALD THOMAS E
US21 patents
⚠️ This page may combine multiple inventors who share the name “TIWALD THOMAS E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
J A WOOLLAM CO INC
17 patentsUS7385697B2Jun 10, 2008
Sample analysis methodology utilizing electromagnetic radiation
J A WOOLLAM CO INC19 citations83
US7110912B1Sep 19, 2006
Method of applying parametric oscillators to model dielectric functions
J A WOOLLAM CO INC12 citations83
US6801312B1Oct 5, 2004
Method for evaluating complex refractive indicies utilizing IR range ellipsometry
J A WOOLLAM CO INC17 citations83
US9851294B1Dec 26, 2017
Integrated mid-infrared, far infrared and terahertz optical Hall effect (OHE) instrument, and method of use
J A WOOLLAM CO INC9 citations81
US7283234B1Oct 16, 2007
Use of ellipsometry and surface plasmon resonance in monitoring thin film deposition or removal from a substrate surface
J A WOOLLAM CO INC7 citations74
US7817266B2Oct 19, 2010
Small volume cell
J A WOOLLAM CO INC7 citations73
US6738139B1May 18, 2004
Method of determining bulk refractive indicies of fluids from thin films thereof
J A WOOLLAM CO INC7 citations73
US9599569B2Mar 21, 2017
Method to enhance sensitivity to surface normal optical functions of anisotropic films using attenuated total reflection
J A WOOLLAM CO INC2 citations71
US10073120B1Sep 11, 2018
Integrated vacuum-ultraviolet, mid and near-ultraviolet, visible, near, mid and far infrared and terahertz optical hall effect (OHE) instrument, and method of use
J A WOOLLAM CO INC7 citations69
US7623237B1Nov 24, 2009
Sample investigating system
J A WOOLLAM CO INC5 citations63
US7349092B1Mar 25, 2008
System for reducing stress induced effects during determination of fluid optical constants
J A WOOLLAM CO INC4 citations63
US6455853B2Sep 24, 2002
Determination of thickness and impurity profiles in thin membranes utilizing spectorscopic data obtained from ellipsometric investigation of both front and back surfaces
J A WOOLLAM CO INC6 citations63
US7636161B1Dec 22, 2009
Back surface reflection reduction systems and methodology
J A WOOLLAM CO INC3 citations62
US7265839B1Sep 4, 2007
Horizontal attenuated total reflection system
J A WOOLLAM CO INC6 citations62
US7187443B1Mar 6, 2007
Method of determining bulk refractive indicies of liquids from thin films thereof
J A WOOLLAM CO INC3 citations62
US7193709B1Mar 20, 2007
Ellipsometric investigation of thin films
J A WOOLLAM CO INC1 citations52
US7777883B2Aug 17, 2010
Ellipsometric investigation of anisotropic samples
J A WOOLLAM CO INC1 citations51