Inventor
ENACHESCU MARIAN
US4 patents
Patents
4 patentsUS6840666B2Jan 11, 2005
Methods and systems employing infrared thermography for defect detection and analysis
MARENA SYSTEMS CORP50 citations93
US7149343B2Dec 12, 2006
Methods for analyzing defect artifacts to precisely locate corresponding defects
MARENA SYSTEMS CORP22 citations89
US7538815B1May 26, 2009
Autofocus system and method using focus measure gradient
MARENA SYSTEMS CORP15 citations81
US7551769B2Jun 23, 2009
Data structures and algorithms for precise defect location by analyzing artifacts
MARENA SYSTEMS CORP2 citations59