Inventor
SONG YUNSHENG
US30 patents
⚠️ This page may combine multiple inventors who share the name “SONG YUNSHENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
12 patentsUS9519210B2Dec 13, 2016
Voltage contrast characterization structures and methods for within chip process variation characterization
IBM57 citations97
US7856332B2Dec 21, 2010
Real time system for monitoring the commonality, sensitivity, and repeatability of test probes
IBM13 citations82
US9524930B2Dec 20, 2016
Configurable interposer
IBM4 citations73
US8803328B1Aug 12, 2014
Random coded integrated circuit structures and methods of making random coded integrated circuit structures
IBM6 citations73
US8369976B2Feb 5, 2013
Method for compensating for tool processing variation in the routing of wafers/lots
IBM4 citations63
US7962234B2Jun 14, 2011
Multidimensional process window optimization in semiconductor manufacturing
IBM5 citations62
US7908023B2Mar 15, 2011
Method of establishing a lot grade system for product lots in a semiconductor manufacturing process
IBM2 citations61
US7682842B2Mar 23, 2010
Method of adaptively selecting chips for reducing in-line testing in a semiconductor manufacturing line
IBM5 citations61
US8005560B2Aug 23, 2011
Method of optimizing queue times in a production cycle
IBM5 citations60
US7337033B1Feb 26, 2008
Data mining to detect performance quality of tools used repetitively in manufacturing
IBM5 citations57
US8015040B2Sep 6, 2011
Methods, systems, and computer program products for product randomization and analysis in a manufacturing environment
IBM1 citations44
US7953680B2May 31, 2011
Computer program product for excluding variations attributable to equipment used in semiconductor wafer manufacturing from split analysis procedures
IBM0 citations42
GLUSCHENKOV OLEG
4 patentsUS8237278B2Aug 7, 2012
Configurable interposer
GLUSCHENKOV OLEG29 citations92
US8159247B2Apr 17, 2012
Yield enhancement for stacked chips through rotationally-connecting-interposer
GLUSCHENKOV OLEG4 citations61
US9151781B2Oct 6, 2015
Yield enhancement for stacked chips through rotationally-connecting-interposer
GLUSCHENKOV OLEG0 citations51
US8759152B2Jun 24, 2014
Configurable interposer
GLUSCHENKOV OLEG0 citations51
OUYANG XU
3 patentsUS8095230B2Jan 10, 2012
Method for optimizing the routing of wafers/lots based on yield
OUYANG XU10 citations83
US8294485B2Oct 23, 2012
Detecting asymmetrical transistor leakage defects
OUYANG XU4 citations62
US9780007B2Oct 3, 2017
LCR test circuit structure for detecting metal gate defect conditions
OUYANG XU0 citations51
GLOBALFOUNDRIES INC
3 patentsUS9559051B1Jan 31, 2017
Method for manufacturing in a semiconductor device a low resistance via without a bottom liner
GLOBALFOUNDRIES INC3 citations71
US10109046B2Oct 23, 2018
Methods of detecting faults in real-time for semiconductor wafers
GLOBALFOUNDRIES INC3 citations68
US9337334B2May 10, 2016
Semiconductor memory device employing a ferromagnetic gate
GLOBALFOUNDRIES INC0 citations42