Inventor
WU TSIAO-CHEN
TW25 patents
⚠️ This page may combine multiple inventors who share the name “WU TSIAO-CHEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
14 patentsUS11243461B2Feb 8, 2022
Reflective mask and fabricating method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US11402761B2Aug 2, 2022
Semiconductor lithography system and/or method
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US9538628B1Jan 3, 2017
Method for EUV power improvement with fuel droplet trajectory stabilization
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9864270B2Jan 9, 2018
Pellicle and method for manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations71
US12321100B2Jun 3, 2025
Semiconductor lithography system and/or method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12038684B2Jul 16, 2024
Reflective mask and fabricating method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11921430B2Mar 5, 2024
Semiconductor lithography system and/or method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11630386B2Apr 18, 2023
Reflective mask and fabricating method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11199767B2Dec 14, 2021
Apparatus and method for generating an electromagnetic radiation
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10509311B1Dec 17, 2019
Apparatus and method for generating an electromagnetic radiation
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US10162276B2Dec 25, 2018
Apparatus for shielding reticle
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US8988652B2Mar 24, 2015
Method and apparatus for ultraviolet (UV) patterning with reduced outgassing
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10310380B2Jun 4, 2019
High-brightness light source
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US9847302B2Dec 19, 2017
Wafer surface conditioning for stability in fab environment
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations41
TAIWAN SEMICONDUCTOR MFG
6 patentsUS9213232B2Dec 15, 2015
Reflective mask and method of making same
TAIWAN SEMICONDUCTOR MFG5 citations84
US6383693B1May 7, 2002
Method of forming a photomask utilizing electron beam dosage compensation method employing dummy pattern
TAIWAN SEMICONDUCTOR MFG10 citations73
US7169701B2Jan 30, 2007
Dual damascene trench formation to avoid low-K dielectric damage
TAIWAN SEMICONDUCTOR MFG6 citations63
US7838173B2Nov 23, 2010
Structure design and fabrication on photomask for contact hole manufacturing process window enhancement
TAIWAN SEMICONDUCTOR MFG3 citations62
US9389506B2Jul 12, 2016
Photoresist having improved extreme-ultraviolet lithography imaging performance
TAIWAN SEMICONDUCTOR MFG1 citations52
US8815496B2Aug 26, 2014
Method for patterning a photosensitive layer
TAIWAN SEMICONDUCTOR MFG0 citations51