Inventor
TAKEUCHI SEIJI
US82 patents
⚠️ This page may combine multiple inventors who share the name “TAKEUCHI SEIJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CANON KK
24 patentsUS5610715AMar 11, 1997
Displacement detecting system, an expose apparatus, and a device manufacturing method employing a scale whose displacement is detected by a selected detection head
CANON KK397 citations99
US5486919AJan 23, 1996
Inspection method and apparatus for inspecting a particle, if any, on a substrate having a pattern
CANON KK155 citations99
US5767962AJun 16, 1998
Inspection system and device manufacturing method using the same
CANON KK102 citations98
US6594012B2Jul 15, 2003
Exposure apparatus
CANON KK32 citations93
US6295118B1Sep 25, 2001
Optical arrangement for exposure apparatus
CANON KK23 citations93
US5861952AJan 19, 1999
Optical inspection method and apparatus including intensity modulation of a light beam and detection of light scattered at an inspection position
CANON KK37 citations93
US5777744AJul 7, 1998
Exposure state detecting system and exposure apparatus using the same
CANON KK46 citations93
US5750294AMay 12, 1998
Best focus determining method
CANON KK30 citations93
US5585918ADec 17, 1996
Foreign particle inspecting system
CANON KK39 citations93
US5541729AJul 30, 1996
Measuring apparatus utilizing diffraction of reflected and transmitted light
CANON KK21 citations93
US5461474AOct 24, 1995
Inspection apparatus for detecting foreign matter on a surface to be inspected, and an exposure apparatus and a device manufacturing method using the same
CANON KK49 citations93
US5321502AJun 14, 1994
Measuring method and measuring apparatus
CANON KK25 citations93
US7508493B2Mar 24, 2009
Exposure apparatus and device manufacturing method
CANON KK30 citations92
US7095497B2Aug 22, 2006
Beam splitting apparatus, transmittance measurement apparatus, and exposure apparatus
CANON KK16 citations92
US5652657AJul 29, 1997
Inspection system for original with pellicle
CANON KK44 citations92
US7675629B2Mar 9, 2010
Exposure apparatus and device manufacturing method using a common path interferometer to form an interference pattern and a processor to calculate optical characteristics of projection optics using the interference pattern
CANON KK14 citations84
US7251029B2Jul 31, 2007
Birefringence measurement apparatus, strain remover, polarimeter and exposure apparatus
CANON KK12 citations83
US7015456B2Mar 21, 2006
Exposure apparatus that acquires information regarding a polarization state of light from a light source
CANON KK11 citations83
US7573563B2Aug 11, 2009
Exposure apparatus and device manufacturing method
CANON KK7 citations74
US7030998B2Apr 18, 2006
Phase measurement apparatus for measuring characterization of optical thin films
CANON KK8 citations74
US5742386AApr 21, 1998
Apparatus for detecting foreign matter on a substrate, and an exposure apparatus including the same
CANON KK14 citations74
US5404220AApr 4, 1995
Measuring method and measuring apparatus for determining the relative displacement of a diffraction grating with respect to a plurality of beams
CANON KK11 citations74
US7286226B2Oct 23, 2007
Method and apparatus for measuring birefringence
CANON KK8 citations73
US6967796B2Nov 22, 2005
Optical element and optical system
CANON KK8 citations73
HITACHI LTD
12 patentsUS6638662B2Oct 28, 2003
Lithium secondary battery having oxide particles embedded in particles of carbonaceous material as a negative electrode-active material
HITACHI LTD101 citations97
US6030726AFeb 29, 2000
Lithium secondary battery having negative electrode of carbon material which bears metals
HITACHI LTD109 citations97
US4178270ADec 11, 1979
Method for supporting hydrous metal oxide on carrier
HITACHI LTD59 citations96
US6524749B1Feb 25, 2003
Lithium secondary battery, and process for producing the same
HITACHI LTD46 citations95
US4810597AMar 7, 1989
Fuel cell comprising a device for detecting the concentration of methanol
HITACHI LTD120 citations95
US4070284AJan 24, 1978
Liquid chromatography and apparatus for the same
HITACHI LTD60 citations95
US4894355AJan 16, 1990
Flexible, water-repellent baked carbon plate, its production, fuel cell electrode, fuel cell electrode plate and its production and fuel cell
HITACHI LTD69 citations94
US6268086B1Jul 31, 2001
Non-aqueous secondary battery and a method of manufacturing graphite powder
HITACHI LTD18 citations92
US6083645AJul 4, 2000
Secondary battery using system and material for negative electrode of secondary battery
HITACHI LTD24 citations92
US4073725AFeb 14, 1978
Method and apparatus for liquid chromatography under elevated pressure
HITACHI LTD42 citations91
US4133753AJan 9, 1979
Method of ion exchange chromatography
HITACHI LTD28 citations82
US6383467B1May 7, 2002
Non-aqueous secondary battery and a method of manufacturing graphite powder
HITACHI LTD10 citations73
FELL DON LTD
3 patentsCANON USA INC
3 patentsUS11497382B1Nov 15, 2022
Apparatus and method for endoscopic image orientation control
CANON USA INC10 citations84
US10682044B2Jun 16, 2020
Spectrally encoded forward view and spectrally encoded multi-view endoscope using back-reflected light between reflective surfaces
CANON USA INC2 citations73
US10530976B2Jan 7, 2020
Endoscope probes and systems, and methods for use therewith
CANON USA INC4 citations71
SEMICONDUCTOR COMPONENTS IND LLC
3 patentsUS10658986B2May 19, 2020
Methods and apparatus for driver calibration
SEMICONDUCTOR COMPONENTS IND LLC5 citations84
US11770105B2Sep 26, 2023
Methods and apparatus for driver calibration
SEMICONDUCTOR COMPONENTS IND LLC1 citations73
US12283921B2Apr 22, 2025
Methods and apparatus for driver calibration
SEMICONDUCTOR COMPONENTS IND LLC0 citations63
SHIN KOBE ELECTRIC MACHINERY
1 patentASAHI KASEI MICRODEVICES CORP
1 patentSANYO ELECTRIC CO
1 patentTOSHIBA KK
1 patentSHARP KK
1 patentShowing the top 50 of 82 patents by PatentIndex Score.