P

Inventor

CHAN YUCHENG

CN26 patents
⚠️ This page may combine multiple inventors who share the name “CHAN YUCHENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

BOE TECHNOLOGY GROUP CO LTD

14 patents
US12232349B2Feb 18, 2025

Display device

BOE TECHNOLOGY GROUP CO LTD2 citations74
US11348356B2May 31, 2022

Display substrate, fingerprint recognition method, and touch display device

BOE TECHNOLOGY GROUP CO LTD5 citations72
US10197877B2Feb 5, 2019

Array substrate and method for manufacturing the same and display device

BOE TECHNOLOGY GROUP CO LTD2 citations72
US10622427B2Apr 14, 2020

Array substrate, manufacturing method thereof, and display apparatus

BOE TECHNOLOGY GROUP CO LTD2 citations70
US11133196B2Sep 28, 2021

Gate electrode and method for manufacturing the same, and method for manufacturing array substrate

BOE TECHNOLOGY GROUP CO LTD0 citations61
US10224252B2Mar 5, 2019

Method for fabricating array substrate, array substrate and display device

BOE TECHNOLOGY GROUP CO LTD1 citations61
US10429412B2Oct 1, 2019

Test circuit, test method, array substrate and manufacturing method thereof

BOE TECHNOLOGY GROUP CO LTD0 citations52
US10243004B2Mar 26, 2019

Low-temperature polycrystalline silicon thin film transistor, and manufacturing method for fabricating the same, array substrate, display panel and display device

BOE TECHNOLOGY GROUP CO LTD0 citations51
US12557542B2Feb 17, 2026

Stretchable display panel and manufacturing method therefor, and display device

BOE TECHNOLOGY GROUP CO LTD0 citations50
US9847357B2Dec 19, 2017

Thin film transistor that includes group VB metal oxide insulating layer

BOE TECHNOLOGY GROUP CO LTD0 citations48
US10825930B2Nov 3, 2020

Thin film transistor and manufacture method thereof

BOE TECHNOLOGY GROUP CO LTD0 citations41
US10446410B2Oct 15, 2019

Method of processing surface of polysilicon and method of processing surface of substrate assembly

BOE TECHNOLOGY GROUP CO LTD0 citations41
US9893131B2Feb 13, 2018

Test element group, method of testing electrical characteristics of semiconductor elements, and fabricating method thereof

BOE TECHNOLOGY GROUP CO LTD0 citations41
US9893165B2Feb 13, 2018

Method for manufacturing array substrate and manufacturing device

BOE TECHNOLOGY GROUP CO LTD0 citations37

CHENGDU BOE OPTOELECT TECH CO

8 patents

ORDOS YUANSHENG OPTOELECTRONICS CO LTD

2 patents

CHONGQING BOE DISPLAY TECH CO LTD

2 patents