Inventor
KUROYANAGI AKIRA
JP43 patents
⚠️ This page may combine multiple inventors who share the name “KUROYANAGI AKIRA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NIPPON DENSO CO
20 patentsUS5877095AMar 2, 1999
Method of fabricating a semiconductor device having a silicon nitride film made of silane, ammonia and nitrogen
NIPPON DENSO CO577 citations98
US5689130ANov 18, 1997
Vertical semiconductor device with ground surface providing a reduced ON resistance
NIPPON DENSO CO32 citations96
US5242862ASep 7, 1993
Semiconductor device and method of manufacturing same
NIPPON DENSO CO38 citations96
US5017979AMay 21, 1991
EEPROM semiconductor memory device
NIPPON DENSO CO41 citations96
US4975390ADec 4, 1990
Method of fabricating a semiconductor pressure sensor
NIPPON DENSO CO125 citations96
US5470771ANov 28, 1995
Method of manufacturing a floating gate memory device
NIPPON DENSO CO32 citations93
US5654560AAug 5, 1997
Semiconductor device with current detecting function and method of producing the same
NIPPON DENSO CO40 citations92
US5453390ASep 26, 1995
Method of producing semiconductor device with current detecting function
NIPPON DENSO CO21 citations92
US5250449AOct 5, 1993
Vertical type semiconductor device and method for producing the same
NIPPON DENSO CO45 citations92
US5410171AApr 25, 1995
Vertical type semiconductor with main current section and emulation current section
NIPPON DENSO CO29 citations91
US5462896AOct 31, 1995
Method of forming a sidewall on a semiconductor element
NIPPON DENSO CO20 citations88
US5798550AAug 25, 1998
Vertical type semiconductor device and gate structure
NIPPON DENSO CO17 citations83
US5550067AAug 27, 1996
Method for producing semiconductor device having DMOS and NMOS elements formed in the same substrate
NIPPON DENSO CO20 citations83
US5830771ANov 3, 1998
Manufacturing method for semiconductor device
NIPPON DENSO CO19 citations82
US5663096ASep 2, 1997
Method of manufacturing a vertical semiconductor device with ground surface providing a reduced ON resistance
NIPPON DENSO CO13 citations82
US5063423ANov 5, 1991
Semiconductor memory device of a floating gate tunnel oxide type
NIPPON DENSO CO21 citations82
US5592004AJan 7, 1997
Silicon nitride film having a short absorption wavelength and surrounding crystal-like grain boundaries
NIPPON DENSO CO16 citations80
US5994187ANov 30, 1999
Method of manufacturing a vertical semiconductor device
NIPPON DENSO CO8 citations74
US6365458B1Apr 2, 2002
Semiconductor memory device and method of manufacturing the same
NIPPON DENSO CO2 citations63
US5534454AJul 9, 1996
Method of producing a semiconductor device having accurate current detection
NIPPON DENSO CO1 citations50
DENSO CORP
18 patentsUS6469345B2Oct 22, 2002
Semiconductor device and method for manufacturing the same
DENSO CORP55 citations96
US6946711B2Sep 20, 2005
Semiconductor device
DENSO CORP18 citations92
US6809348B1Oct 26, 2004
Semiconductor device and method for manufacturing the same
DENSO CORP19 citations91
US5714408AFeb 3, 1998
Method of forming silicon nitride with varied hydrogen concentration
DENSO CORP33 citations91
US6903417B2Jun 7, 2005
Power semiconductor device
DENSO CORP4 citations74
US6498366B1Dec 24, 2002
Semiconductor device that exhibits decreased contact resistance between substrate and drain electrode
DENSO CORP6 citations74
US7354829B2Apr 8, 2008
Trench-gate transistor with ono gate dielectric and fabrication process therefor
DENSO CORP7 citations73
US6864532B2Mar 8, 2005
Semiconductor device and method for manufacturing the same
DENSO CORP10 citations73
US6137156AOct 24, 2000
Semiconductor device employing silicon nitride layers with varied hydrogen concentration
DENSO CORP7 citations72
US6949434B2Sep 27, 2005
Method of manufacturing a vertical semiconductor device
DENSO CORP2 citations63
US6525400B2Feb 25, 2003
Semiconductor memory device and method of manufacturing the same
DENSO CORP4 citations63
US7859165B2Dec 28, 2010
Fuel pump and motor device for the same
DENSO CORP4 citations62
US6972459B2Dec 6, 2005
Metal oxide semiconductor transistor having a nitrogen cluster containing layer embedded in the substrate
DENSO CORP2 citations62
US7300274B2Nov 27, 2007
Change-over device for changing over between a heating medium and a resin material at a time of a secondary forming
DENSO CORP4 citations59
US7064033B2Jun 20, 2006
Semiconductor device and method of manufacturing same
DENSO CORP0 citations52
US6649478B2Nov 18, 2003
Semiconductor device and method of manufacturing same
DENSO CORP0 citations52
US7459118B2Dec 2, 2008
Heated medium supplying method and structure for secondary molding of resin molded component
DENSO CORP1 citations48
US7438842B2Oct 21, 2008
Method of manufacturing resin molding and change-over device for changing over between heating medium and resin material in process of secondary forming
DENSO CORP1 citations48