Inventor

MEIER STEPHEN F

US11 patents

⚠️ This page may combine multiple inventors who share the name “MEIER STEPHEN F”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SYNOPSYS INC

5 patents

US6345379B1Feb 5, 2002

Method and apparatus for estimating internal power consumption of an electronic circuit represented as netlist

SYNOPSYS INC123 citations97

US6075932AJun 13, 2000

Method and apparatus for estimating internal power consumption of an electronic circuit represented as netlist

SYNOPSYS INC93 citations97

US5696694ADec 9, 1997

Method and apparatus for estimating internal power consumption of an electronic circuit represented as netlist

SYNOPSYS INC114 citations97

US5668732ASep 16, 1997

Method for estimating power consumption of a cyclic sequential electronic circuit

SYNOPSYS INC96 citations95

US5682320AOct 28, 1997

Method for electronic memory management during estimation of average power consumption of an electronic circuit

SYNOPSYS INC60 citations94

FUJIMURA AKIRA

2 patents

US8473875B2Jun 25, 2013

Method and system for forming high accuracy patterns using charged particle beam lithography

FUJIMURA AKIRA39 citations97

US9057956B2Jun 16, 2015

Method and system for design of enhanced edge slope patterns for charged particle beam lithography

FUJIMURA AKIRA9 citations83

D2S INC

2 patents

US9043734B2May 26, 2015

Method and system for forming high accuracy patterns using charged particle beam lithography

D2S INC13 citations92

US9612530B2Apr 4, 2017

Method and system for design of enhanced edge slope patterns for charged particle beam lithography

D2S INC4 citations72

CANDESCENT TECH CORP

1 patent

US6714017B2Mar 30, 2004

Method and system for infrared detection of electrical short defects

CANDESCENT TECH CORP13 citations79

PHASE METRICS INC

1 patent

US5872664AFeb 16, 1999

Distortion of an isolated pulse

PHASE METRICS INC9 citations73