Inventor

KOZACZEK KRZYSZTOF J

US4 patents

⚠️ This page may combine multiple inventors who share the name “KOZACZEK KRZYSZTOF J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HYPERNEX INC

3 patents

US6301330B1Oct 9, 2001

Apparatus and method for texture analysis on semiconductor wafers

HYPERNEX INC44 citations90

US6678347B1Jan 13, 2004

Method and apparatus for quantitative phase analysis of textured polycrystalline materials

HYPERNEX INC20 citations89

US6792075B2Sep 14, 2004

Method and apparatus for thin film thickness mapping

HYPERNEX INC4 citations60

IBM

1 patent

US6909772B2Jun 21, 2005

Method and apparatus for thin film thickness mapping

IBM3 citations61